TRANSPORT PROPERTIES OF LixCu(1 − x)O
1993 ◽
Vol 07
(03)
◽
pp. 163-169
◽
Keyword(s):
The resistivity of Li doped CuO polycrystalline samples is discussed following the variable-range hopping mechanism (VRH) form, exp ((T0/T)1/4), between 80 and 300 K. The T0 have been measured to be in the range of 107 − 108 K . In the CuO undoped system, the VRH mechanism does not fit appreciably the resistivity data in the range of temperature considered. However, when Li is introduced, this behaviour is followed, leading us to suggest that the Li doped CuO could be view as a disordered system. At higher temperatures, the thermal activation mechanism takes place.
2007 ◽
Vol 19
(26)
◽
pp. 266218
◽
1998 ◽
Vol 12
(29n31)
◽
pp. 3338-3341
Keyword(s):
2013 ◽
Vol 488
◽
pp. 9-13
◽
2011 ◽
Vol 25
(28)
◽
pp. 3825-3833
2011 ◽
Vol 116
(8)
◽
pp. 4979-4985
◽