ELECTRICAL RESISTIVITY OF NANOSTRUCTURED PLATINUM AND GOLD THIN FILMS

2004 ◽  
Vol 11 (02) ◽  
pp. 223-227 ◽  
Author(s):  
M. C. SALVADORI ◽  
A. R. VAZ ◽  
R. J. C. FARIAS ◽  
M. CATTANI
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Surface Roughness ◽  
Electrical Resistivity ◽  
Room Temperature ◽  
Theoretical Estimate ◽  
Vacuum Arc ◽  
Arc Plasma ◽  
Correlation Lengths ◽  
Gold Thin Films

We have measured, at room temperature, the resistivity, the surface roughness and the lateral surface correlation lengths of nanostructured platinum and gold thin films. The films' thickness d, deposited by vacuum arc plasma, is in the range 1.31≤d≤11.66 nm for platinum and 1.77≤d≤10.46 nm for gold. A theoretical estimate of our experimental data has been made.

scholarly journals Nano-additively manufactured gold thin films with high adhesion and near-bulk electrical resistivity via jet-assisted, nanoparticle-dominated, room-temperature microsputtering

2020 ◽  
Vol 36 ◽  
pp. 101679
Author(s):  
Yosef Kornbluth ◽  
Richard Mathews ◽  
Lalitha Parameswaran ◽  
Livia M. Racz ◽  
Luis F. Velásquez-García
Keyword(s):  
Thin Films ◽  
Electrical Resistivity ◽  
Room Temperature ◽  
High Adhesion ◽  
Gold Thin Films

CONTRIBUTION OF THE MORPHOLOGICAL GRAIN SIZES TO THE ELECTRICAL RESISTIVITY OF PLATINUM AND GOLD THIN FILMS

2004 ◽  
Vol 11 (04n05) ◽  
pp. 463-467 ◽  
Author(s):  
M. CATTANI ◽  
M. C. SALVADORI
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Electrical Resistivity ◽  
Theoretical Approach ◽  
Essential Role ◽  
Metallic Thin Films ◽  
Grain Sizes ◽  
Electrical Resistivities ◽  
Gold Thin Films

We have measured the morphological grain sizes of nanostructured platinum and gold thin films. In previous works their electrical resistivities have been measured and a theoretical approach was proposed to explain the resistivity experimental data. It will be shown that within the framework of our theoretical approach, the morphological grain sizes play an essential role in the electrical resistivity of these metallic thin films.

ELECTRICAL RESISTIVITY OF PLATINUM AND GOLD THIN FILMS: A THEORETICAL APPROACH

2004 ◽  
Vol 11 (03) ◽  
pp. 283-290 ◽  
Author(s):  
M. CATTANI ◽  
M. C. SALVADORI
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Electrical Resistivity ◽  
Quantum Mechanical ◽  
Quantum Approach ◽  
Mechanical Approach ◽  
Gold Thin Films ◽  
Quantum Mechanical Approach ◽  
Theory And Experiment ◽  
Good Agreement

In a recent work we have proposed a quantum-mechanical approach to explaining our resistivity experimental results for platinum and gold thin films. Good agreement was found between theory and experiment. In that work only the main features of our calculations were pointed out. In the present work the quantum approach calculations are shown in detail and the predictions are compared with our experimental data.

scholarly journals Electrical resistivity and elastic wave propagation anisotropy in glancing angle deposited tungsten and gold thin films

2019 ◽  
Vol 475 ◽  
pp. 606-614 ◽  
Author(s):  
Raya El Beainou ◽  
Asma Chargui ◽  
Paulo Pedrosa ◽  
Alexis Mosset ◽  
Sébastien Euphrasie ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Resistivity ◽  
Wave Propagation ◽  
Elastic Wave ◽  
Elastic Wave Propagation ◽  
Glancing Angle ◽  
Gold Thin Films

Structural and electrical resistivity characteristics of vacuum arc ion deposited zirconium nitride thin films

2015 ◽  
Vol 30 ◽  
pp. 486-493 ◽  
Author(s):  
Shakil Khan ◽  
Mazhar Mehmood ◽  
Ishaq Ahmad ◽  
Farhat Ali ◽  
A. Shah
Keyword(s):  
Thin Films ◽  
Electrical Resistivity ◽  
Zirconium Nitride ◽  
Vacuum Arc

Evaluation of the Autocorrelation Functions Used When Investigating Surface Roughness

1979 ◽  
Vol 21 (2) ◽  
pp. 105-113 ◽  
Author(s):  
I. V. Loukjanov
Keyword(s):  
Experimental Data ◽  
Surface Roughness ◽  
Surface Texture ◽  
Correlation Functions ◽  
Process Analysis ◽  
Approximate Evaluation ◽  
Approximate Methods ◽  
Autocorrelation Functions ◽  
Correlation Lengths ◽  
Texture Parameters

The use of autocorrelation functions and correlation lengths in surface texture investigation is considered. Approximate methods for evaluating correlation functions using random-process analysis are considered. Experimental data are also given. In particular, some important properties of the surface texture parameters, Sm and S, used in the approximate evaluation of the autocorrelation function, are considered.

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