ELECTRICAL RESISTIVITY OF PLATINUM AND GOLD THIN FILMS: A THEORETICAL APPROACH

2004 ◽  
Vol 11 (03) ◽  
pp. 283-290 ◽  
Author(s):  
M. CATTANI ◽  
M. C. SALVADORI
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Electrical Resistivity ◽  
Quantum Mechanical ◽  
Quantum Approach ◽  
Mechanical Approach ◽  
Gold Thin Films ◽  
Quantum Mechanical Approach ◽  
Theory And Experiment ◽  
Good Agreement

In a recent work we have proposed a quantum-mechanical approach to explaining our resistivity experimental results for platinum and gold thin films. Good agreement was found between theory and experiment. In that work only the main features of our calculations were pointed out. In the present work the quantum approach calculations are shown in detail and the predictions are compared with our experimental data.

ELECTRICAL RESISTIVITY OF NANOSTRUCTURED PLATINUM AND GOLD THIN FILMS

2004 ◽  
Vol 11 (02) ◽  
pp. 223-227 ◽  
Author(s):  
M. C. SALVADORI ◽  
A. R. VAZ ◽  
R. J. C. FARIAS ◽  
M. CATTANI
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Surface Roughness ◽  
Electrical Resistivity ◽  
Room Temperature ◽  
Theoretical Estimate ◽  
Vacuum Arc ◽  
Arc Plasma ◽  
Correlation Lengths ◽  
Gold Thin Films

We have measured, at room temperature, the resistivity, the surface roughness and the lateral surface correlation lengths of nanostructured platinum and gold thin films. The films' thickness d, deposited by vacuum arc plasma, is in the range 1.31≤d≤11.66 nm for platinum and 1.77≤d≤10.46 nm for gold. A theoretical estimate of our experimental data has been made.

QUANTUM THEORY OF NEUTRON DIFFRACTION

2009 ◽  
Vol 23 (15) ◽  
pp. 3255-3264 ◽  
Author(s):  
XIANG-YAO WU ◽  
BAI-JUN ZHANG ◽  
XIAO-JING LIU ◽  
BING LIU ◽  
CHUN-LI ZHANG ◽  
...  
Keyword(s):  
Experimental Data ◽  
Quantum Theory ◽  
Neutron Diffraction ◽  
Quantum Mechanical ◽  
Cold Neutrons ◽  
Calculation Results ◽  
Mechanical Approach ◽  
Quantum Mechanical Approach ◽  
Double Slit

Phenomena of electron, neutron, atomic, and molecular diffraction have been studied in many experiments, and these experiments have been explained by some theoretical works. We study neutron single and double-slit diffraction with a new quantum mechanical approach. The calculation results are compared with the experimental data obtained with cold neutrons.

CONTRIBUTION OF THE MORPHOLOGICAL GRAIN SIZES TO THE ELECTRICAL RESISTIVITY OF PLATINUM AND GOLD THIN FILMS

2004 ◽  
Vol 11 (04n05) ◽  
pp. 463-467 ◽  
Author(s):  
M. CATTANI ◽  
M. C. SALVADORI
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Electrical Resistivity ◽  
Theoretical Approach ◽  
Essential Role ◽  
Metallic Thin Films ◽  
Grain Sizes ◽  
Electrical Resistivities ◽  
Gold Thin Films

We have measured the morphological grain sizes of nanostructured platinum and gold thin films. In previous works their electrical resistivities have been measured and a theoretical approach was proposed to explain the resistivity experimental data. It will be shown that within the framework of our theoretical approach, the morphological grain sizes play an essential role in the electrical resistivity of these metallic thin films.

ELECTRICAL RESISTIVITY OF VERY THIN METALLIC FILMS WITH ISOTROPIC AND ANISOTROPIC SURFACES

2007 ◽  
Vol 14 (03) ◽  
pp. 345-356 ◽  
Author(s):  
M. CATTANI ◽  
M. C. SALVADORI ◽  
F. S. TEIXEIRA ◽  
R. S. WIEDERKEHR ◽  
I. G. BROWN
Keyword(s):  
Electrical Resistivity ◽  
Morphological Properties ◽  
Quantum Mechanical ◽  
Metallic Films ◽  
Electrical Conductivities ◽  
Electrical Resistivities ◽  
Mechanical Approach ◽  
Quantum Mechanical Approach ◽  
Pt Films ◽  
Nm Range

A quantum mechanical approach is developed to calculate the surface-induced electrical conductivities of very thin metallic films with isotropic and anisotropic surfaces. Two particular cases are analyzed with this formalism: (1) films with isotropic surfaces and (2) films with anisotropic surfaces which have different morphological properties along two orthogonal directions. It is shown that, depending on the differences between these morphological properties, the surface-induced resistivities can be different along these directions. In order to investigate the validity of these predictions we have fabricated Pt films, with thickness in the 0.90 ≤ d ≤ 11.10 nm range, with very different morphological properties along two orthogonal directions. Measuring the electrical resistivities of these films, we have found different resistivities along these directions. We show that this anisotropic resistivity can be well explained by our theoretical approach.

Quantitative Prediction of Aggregation‐Induced Emission: A Full Quantum Mechanical Approach to the Optical Spectra

2020 ◽  
Vol 132 (28) ◽  
pp. 11647-11652
Author(s):  
Wei Zhang ◽  
Jinfeng Liu ◽  
Xinsheng Jin ◽  
Xinggui Gu ◽  
Xiao Cheng Zeng ◽  
...  
Keyword(s):  
Optical Spectra ◽  
Quantitative Prediction ◽  
Quantum Mechanical ◽  
Aggregation Induced Emission ◽  
Mechanical Approach ◽  
Quantum Mechanical Approach ◽  
Full Quantum

Simulation and prediction of optical characterization of casting (Adamantan-Fulgide) thin films using (CTANNs) approach

2019 ◽  
Vol 33 (11) ◽  
pp. 1950093 ◽  
Author(s):  
A. M. A. EL-Barry ◽  
D. M. Habashy
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Back Propagation ◽  
Optical Characterization ◽  
Experimental Information ◽  
Training Algorithm ◽  
Energy Gaps ◽  
Resilient Back Propagation ◽  
Good Agreement

For reinforcement, the photochromic field and the cooperation between the theoretical and experimental branches of physics, the computational, theoretical artificial neural networks (CTANNs) and the resilient back propagation (R[Formula: see text]) training algorithm were used to model optical characterizations of casting (Admantan-Fulgide) thin films with different concentrations. The simulated values of ANN are in good agreement with the experimental data. The model was also used to predict values, which were not included in the training. The high precision of the model has been constructed. Moreover, the concentration dependence of both the energy gaps and Urbach’s tail were, also tested. The capability of the technique to simulate the experimental information with best accuracy and the foretelling of some concentrations which is not involved in the experimental data recommends it to dominate the modeling technique in casting (Admantan-Fulgide) thin films.

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