RECENT ADVANCES IN ULTRAFAST TIME-RESOLVED SCANNING TUNNELING MICROSCOPY

2018 ◽  
Vol 25 (Supp01) ◽  
pp. 1841003 ◽  
Author(s):  
YE TIAN ◽  
FAN YANG ◽  
CHAOYU GUO ◽  
YING JIANG

Making smaller and faster functional devices has led to an increasing demand for a microscopic technique that allows the investigation of carrier and phonon dynamics with both high spatial and temporal resolutions. Traditional optical pump–probe methods can achieve femtosecond temporal resolution but fall short in the spatial resolution due to the diffraction limit. Scanning tunneling microscopy (STM), on the contrary, has realized atomic-scale spatial resolution relying on the high sensitivity of the tunneling current to the tip-sample distance. However, limited by the electronics bandwidth, STM can only push the temporal resolution to the microseconds scale, restricting its applications to probe various ultrafast dynamic processes. The combination of these two methods takes advantages of optical pump–probe techniques and highly localized tunneling currents of STM, providing one viable solution to track atomic-scale ultrafast dynamics in single molecules and low-dimensional materials. In this review, we will focus on several ultrafast time-resolved STM methods by coupling the tunneling junctions with pulsed electric waves, THz, near-infrared and visible laser. Their applications to probe the carrier dynamics, spin dynamics, and molecular motion will be highlighted. In the end, we will present an outlook on the challenges and new opportunities in this field.

Nanoscale ◽  
2013 ◽  
Vol 5 (19) ◽  
pp. 9170 ◽  
Author(s):  
Munenori Yokota ◽  
Shoji Yoshida ◽  
Yutaka Mera ◽  
Osamu Takeuchi ◽  
Haruhiro Oigawa ◽  
...  

2005 ◽  
Vol 901 ◽  
Author(s):  
Hidemi Shigekawa ◽  
Osamu Takeuchi ◽  
Masahiro Aoyama ◽  
Yasuhiko Terada ◽  
Hiroyuki Kondo ◽  
...  

AbstractBy combining scanning tunneling microscopy (STM) and the optical pump-probe technique using a femtosecond pulse laser, we have developed a new microscopy, shaken pulse-pair-excited STM (SPPX-STM), that enables us to observe the dynamics of electronic structures with the ultimate spatial and temporal resolutions.


2019 ◽  
Vol 21 (14) ◽  
pp. 7256-7260 ◽  
Author(s):  
Zi-Han Wang ◽  
Cheul-Hyun Yoon ◽  
Shoji Yoshida ◽  
Yusuke Arashida ◽  
Osamu Takeuchi ◽  
...  

In current materials science and technologies, surface effects on carrier and spin dynamics in functional materials and devices are of great importance.


2013 ◽  
Vol 222 (5) ◽  
pp. 1161-1175 ◽  
Author(s):  
S. Yoshida ◽  
Y. Terada ◽  
M. Yokota ◽  
O. Takeuchi ◽  
H. Oigawa ◽  
...  

Hyomen Kagaku ◽  
2014 ◽  
Vol 35 (12) ◽  
pp. 656-661
Author(s):  
Hidemi SHIGEKAWA ◽  
Shoji YOSHIDA ◽  
Osamu TAKEUCHI

2019 ◽  
Vol 12 (2) ◽  
pp. 025005 ◽  
Author(s):  
Hiroyuki Mogi ◽  
Zi-han Wang ◽  
Ryusei Kikuchi ◽  
Cheul Hyun Yoon ◽  
Shoji Yoshida ◽  
...  

2002 ◽  
Vol 738 ◽  
Author(s):  
Dzmitry Yarotski ◽  
Antoinette J. Taylor

ABSTRACTWe demonstrate ultrafast dynamical imaging of surfaces using a scanning tunneling microscope with a low-temperature-grown GaAs tip photoexcited by 100-fs, 800-nm pulses. We detect picosecond transients on a coplanar stripline and demonstrate a temporal resolution (full-width at half maximum) of 1.7 ps. By dynamically imaging the stripline, we demonstrate that the local conductivity in the sample is reflected in the transient correlated current and that 20-nm spatial resolution is achievable for a 2 ps transient, correlated signal. We apply this technique of photoconductively-gated ultrafast scanning tunneling microscopy to study carrier dynamics in InAs/GaAs self-assembled quantum dot samples at T=300 K. The initial carrier relaxation proceeds via Auger carrier capture from the InAs wetting layer (WL) on a timescale of 1–2 ps, followed by recombination of carriers on a 900 ps timescale. Finally, we demonstrate junction-mixing ultrafast STM (JM-USTM) using picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt). Using JM-USTM we have achieved a spatio/temporal resolution of 1 nm/8 ps.


Author(s):  
P.E. Russell ◽  
I.H. Musselman

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.


Author(s):  
Mircea Fotino ◽  
D.C. Parks

In the last few years scanning tunneling microscopy (STM) has made it possible and easily accessible to visualize surfaces of conducting specimens at the atomic scale. Such performance allows the detailed characterization of surface morphology in an increasing spectrum of applications in a wide variety of fields. Because the basic imaging process in STM differs fundamentally from its equivalent in other well-established microscopies, good understanding of the imaging mechanism in STM enables one to grasp the correct information content in STM images. It thus appears appropriate to explore by STM the structure of amorphous carbon films because they are used in many applications, in particular in the investigation of delicate biological specimens that may be altered through the preparation procedures.All STM images in the present study were obtained with the commercial instrument Nanoscope II (Digital Instruments, Inc., Santa Barbara, California). Since the importance of the scanning tip for image optimization and artifact reduction cannot be sufficiently emphasized, as stressed by early analyses of STM image formation, great attention has been directed toward adopting the most satisfactory tip geometry. The tips used here consisted either of mechanically sheared Pt/Ir wire (90:10, 0.010" diameter) or of etched W wire (0.030" diameter). The latter were eventually preferred after a two-step procedure for etching in NaOH was found to produce routinely tips with one or more short whiskers that are essentially rigid, uniform and sharp (Fig. 1) . Under these circumstances, atomic-resolution images of cleaved highly-ordered pyro-lytic graphite (HOPG) were reproducibly and readily attained as a standard criterion for easily recognizable and satisfactory performance (Fig. 2).


Sign in / Sign up

Export Citation Format

Share Document