SYNTHESIZED “IN SITU” IN REVERSE MICELLES OF SILVER-SULFIDE SEMICONDUCTORS

1996 ◽  
Vol 03 (01) ◽  
pp. 1215-1218 ◽  
Author(s):  
M.P. PILENI ◽  
L. MOTTE ◽  
F. BILLOUDET ◽  
C. PETIT
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Reverse Micelles ◽  
Silver Sulfide ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Nanosize Particles ◽  
Good Agreement

Functionalized reverse micelles are used to control the size of silver sulfide, Ag 2 S , nanosize particles. The size of the crystallites varies linearly with the water content from 2 to 10 nm. The particles have been coated with dodecanethiol and extracted from micelles. The size of the particles dispersed in heptane has been determined by small-angles x-ray scattering (SAXS) experiments and compared to those obtained by transmission electron microscopy (TEM). A good agreement between results is obtained by these two techniques. A drop of particles previously dispersed in heptane is dried on a carbon grill. A network of the particles forming monolayers of crystallites in a hexagonal distribution appears.

scholarly journals Direct TEM observation of the “acanthite α-Ag2S–argentite β-Ag2S” phase transition in a silver sulfide nanoparticle

2019 ◽  
Vol 1 (4) ◽  
pp. 1581-1588 ◽  
Author(s):  
S. I. Sadovnikov ◽  
E. Yu. Gerasimov
Keyword(s):  
Electron Microscopy ◽  
Phase Transition ◽  
Transmission Electron Microscopy ◽  
Silver Sulfide ◽  
Transmission Electron ◽  
Silver Sulfide Nanoparticles ◽  
Microscopy Method ◽  
Electron Microscopy Method ◽  
First Time

For the first time, the α-Ag2S (acanthite)–β-Ag2S (argentite) phase transition in a single silver sulfide nanoparticles has been observed in situ using a high-resolution transmission electron microscopy method in real time.

scholarly journals Alpha helical surfactant-like peptides self-assemble into pH-dependent nanostructures

Soft Matter ◽  
2021 ◽  
Vol 17 (11) ◽  
pp. 3096-3104
Author(s):  
Valeria Castelletto ◽  
Jani Seitsonen ◽  
Janne Ruokolainen ◽  
Ian W. Hamley
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Small Angle ◽  
Self Assembly ◽  
X Ray ◽  
Cryogenic Transmission Electron Microscopy ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Ph Dependent ◽  
Ray Scattering

A designed surfactant-like peptide is shown, using a combination of cryogenic-transmission electron microscopy and small-angle X-ray scattering, to have remarkable pH-dependent self-assembly properties.

Analysis of InGaN/GaN single quantum wells by X-ray scattering and transmission electron microscopy

2003 ◽  
Vol 240 (2) ◽  
pp. 297-300 ◽  
Author(s):  
T. M. Smeeton ◽  
M. J. Kappers ◽  
J. S. Barnard ◽  
M. E. Vickers ◽  
C. J. Humphreys
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Quantum Wells ◽  
Single Quantum ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Ray Scattering

In situ x-ray study of the γ- to α-Al2O3 phase transformation during atmospheric pressure oxidation of NiAl(110)

2006 ◽  
Vol 21 (12) ◽  
pp. 3047-3057 ◽  
Author(s):  
A. Vlad ◽  
A. Stierle ◽  
N. Kasper ◽  
H. Dosch ◽  
M. Rühle
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Orientation Relationship ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Oxidation In Air ◽  
Α Al2o3 ◽  
Underlying Substrate

The oxidation in air of NiAl(110) was investigated in the temperature range from 870 °C–1200 °C by in situ x-ray diffraction and transmission electron microscopy. Oxidation at 870 °C and 1 bar oxygen leads to the formation of an epitaxial layer of γ-alumina showing an R30° orientation relationship with respect to the underlying substrate. At oxidation temperatures between 950 °C and 1025 °C, we observed a coexistence of epitaxial γ- and polycrystalline δ-Al2O3. The α-Al2O3 starts to form at 1025 °C and the complete transformation of metastable phases to the stable α-alumina phase takes place at 1100 °C. The fcc-hcp martensitic-like transformation of the initial γ-Al2O3 to epitaxial α-Al2O3 was observed. X-ray diffraction and cross-section transmission electron microscopy proved the existence of a continuous epitaxial α-Al2O3 layer between the substrate and the polycrystalline oxide scale, having a thickness of about 150 nm. The relative orientation relationship between the epitaxial alumina and the underlying substrate was found to be NiAl(110) || α-Al2O3 (0001) and [110] NiAl || [1120].

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