SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

scholarly journals Исследование пленок диметилдиимида перилентетракарбоновой кислоты методами циклической термодесорбции и сканирующей зондовой микроскопии

2018 ◽  
Vol 60 (2) ◽  
pp. 255
Author(s):  
А.Е. Почтенный ◽  
А.Н. Лаппо ◽  
И.П. Ильюшонок
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Bandgap Width ◽  
Kelvin Probe ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Spectroscopy

AbstractSome results of studying the direct-current (DC) conductivity of perylenetetracarboxylic acid dimethylimide films by cyclic oxygen thermal desorption are presented. The microscopic parameters of hopping electron transport over localized impurity and intrinsic states were determined. The bandgap width and the sign of major current carriers were determined by scanning probe microscopy methods (atomic force microscopy, scanning probe spectroscopy, and photoassisted Kelvin probe force microscopy). The possibility of the application of photoassisted scanning tunneling microscopy for the nanoscale phase analysis of photoconductive films is discussed.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

Measurement of Plasticity Gradients with Scanning Probe Microscopy

1993 ◽  
Vol 318 ◽  
Author(s):  
James D. Kiely ◽  
Dawn A. Bonnell
Keyword(s):  
Fracture Surface ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Ceramic System ◽  
Force Microscopy ◽  
Metal Fracture ◽  
Atomic Force ◽  
Metal Ceramic

ABSTRACTScanning Tunneling and Atomic Force Microscopy were used to characterize the topography of fractured Au /sapphire interfaces. Variance analysis which quantifies surface morphology was developed and applied to the characterization of the metal fracture surface of the metal/ceramic system. Fracture surface features related to plasticity were quantified and correlated to the fracture energy and energy release rate.

Industrial Applications of Scanning Probe Microscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 522-523
Author(s):  
S. Magonov
Keyword(s):  
Scanning Probe Microscopy ◽  
High Vacuum ◽  
Sample Surface ◽  
Industrial Applications ◽  
Ultra High Vacuum ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Force Microscopy

The evolution of scanning tunneling microscopy (STM) into atomic force microscopy (AFM) have led to a family of scanning probe techniques which are widely applied in fundamental research and in industry. Visualization of the atomic- and molecular-scale structures and the possibility of modifying these structures using a sharp probe were demonstrated with the techniques on many materials. These unique capabilities initiated the further development of AFM and related methods generalized as scanning probe microscopy (SPM). The first STM experiments were performed in the clean conditions of ultra-high vacuum and on well-defined conducting or semi-conducting surfaces. These conditions restrict SPM applications to the real world that requires ambient-condition operation on the samples, many of which are insulators. AFM, which is based on the detection of forces between a tiny cantilever carrying a sharp tip and a sample surface, was introduced to satisfy these requirements. High lateral resolution and unique vertical resolution (angstrom scale) are essential AFM features.

Scanning-probe microscopy of polymers

1993 ◽  
Vol 51 ◽  
pp. 874-875
Author(s):  
Darrell H. Reneker ◽  
Rajkumari Patil ◽  
Seog J. Kim ◽  
Vladimir Tsukruk
Keyword(s):  
Scanning Probe Microscopy ◽  
Domain Boundary ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Lamellar Crystal ◽  
Probe Microscopy ◽  
Atomic Force ◽  
Resolution Observation ◽  
Lamellar Crystals

Scanning probe microscopy techniques, particularly atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are finding a rapidly growing number of applications to both synthetic and biological polymers. Segments of individual polymer molecules can often be observed with atom scale resolution. Observation of polymeric objects as large as 100 microns with nanometer resolution is possible with contemporary AFM, although features caused by the convolution of the shape of the sample and the shape of the tip must be recognized and properly interpreted. The vertical resolution of the atomic force microscope readily provides precise data about the heights of molecules, crystals, and other objects.Lamellar crystals of polyethylene are well characterized objects with many features which can be observed with scanning probe microscopes. Figure 1 shows the fold surface near a fold domain boundary of a lamellar crystal of polyethylene, as observed with an AFM. The folded chain crystal is about 15 nm thick.

COMPARATIVE STUDY OF THIOL FILMS ON C(0001) AND Au(111) SURFACES BY SCANNING PROBE MICROSCOPY

1997 ◽  
Vol 04 (04) ◽  
pp. 637-649 ◽  
Author(s):  
F. TERÁN ARCE ◽  
M. E. VELA ◽  
R. C. SALVAREZZA ◽  
A. J. ARVIA
Keyword(s):  
Pyrolytic Graphite ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Electrochemical Characteristics ◽  
Tunneling Microscopy ◽  
Test Reaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electron Transfer Processes ◽  
Substrate Nature

The structures resulting from 1-dodecanethiol, 1-butanethiol and 1,9-nonanedithiol films produced on highly oriented pyrolytic graphite (HOPG) and gold(111) have been comparatively studied by scanning probe microscopies. Molecular resolution images resulting from atomic force microscopy (AFM) and scanning tunneling microscopy (STM) of different thiol films show the formation of arrays of molecules parallel to the HOPG surface. The electrochemical response of the ferro-ferricyanide reaction was used to test the characteristics of electron transfer processes in thiol-covered HOPG as compared to the bare substrate. The decrease in the heterogeneous rate constant for the test reaction appears to be directly related to the degree of film thickness uniformity. For comparison, films with the same kind of thiols were produced on Au(111). Although the electrochemical characteristics of these films appear to be the same irrespective of the substrate nature, the structure of the films on Au(111) is different from that produced on HOPG.

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