Interference-Free Determination of the Optical Absorption Coefficient and the Optical Gap of Amorphous Silicon Thin Films

1991 ◽  
Vol 30 (Part 1, No. 5) ◽  
pp. 1008-1014 ◽  
Author(s):  
Yoshihiro Hishikawa ◽  
Noboru Nakamura ◽  
Shinya Tsuda ◽  
Shoichi Nakano ◽  
Yasuo Kishi ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Amorphous Silicon ◽  
Optical Absorption Coefficient ◽  
Optical Gap ◽  
Silicon Thin Films

Quantitative photopyroelectric out-of-phase spectroscopy of amorphous silicon thin films deposited on crystalline silicon

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Dynamic Range ◽  
Crystalline Silicon ◽  
Optical Absorption Coefficient ◽  
Si Substrates ◽  
Silicon Thin Films ◽  
Background Compensation

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.

scholarly journals Influence of deposition parameters on the optical absorption of amorphous silicon thin films

2020 ◽  
Vol 2 (3) ◽  
Author(s):  
Lukas Terkowski ◽  
Iain W. Martin ◽  
Daniel Axmann ◽  
Malte Behrendsen ◽  
Felix Pein ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Amorphous Silicon ◽  
Silicon Thin Films ◽  
Deposition Parameters

A New General Method for the Determination of Optical Properties of Amorphous Silicon Films

1990 ◽  
Vol 192 ◽  
Author(s):  
G. Amato ◽  
L. Boarino ◽  
F. Fizzotti ◽  
C. Manfredotti
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Amorphous Silicon ◽  
Optical Response ◽  
The Other ◽  
New Method ◽  
Silicon Thin Films ◽  
Physical Insight ◽  
General Method

ABSTRACTWe propose to apply a new method to model the optical response of amorphous silicon thin films. This method presents the advantage of having a good physical insight. On the other hand, although the model has been originally tested on different materials like a-Si, a-Ge and a-GaAs, we show that it is also sensitive to small differences like those that can exist between intrinsic and doped a-Si:H.

Determination of the optical constants of solar-control amorphous silicon thin films on float glass

2009 ◽  
Vol 41 (7) ◽  
pp. 573-576
Author(s):  
Yong Liu ◽  
Lihong Ni ◽  
Jun Bo Liu ◽  
Qiying Liu ◽  
Chenlu Song ◽  
...  
Keyword(s):  
Thin Films ◽  
Amorphous Silicon ◽  
Optical Constants ◽  
Float Glass ◽  
Silicon Thin Films ◽  
Solar Control
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