Cross-Sectional Transmission Electron Microscopy Study of Si/SiGe Heterojunction Bipolar Transistor Structure Grown by Ultra-High Vacuum Chemical Vapor Deposition
1997 ◽
Vol 36
(Part 2, No. 7B)
◽
pp. L903-L905
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1996 ◽
Vol 27
(5)
◽
pp. 1347-1352
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2002 ◽
Vol 17
(2)
◽
pp. 271-274
◽
2016 ◽
pp. 364-365