Measurement of Energetic and Lateral Distribution of Interface State Density in Fully-Depleted Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors

1999 ◽  
Vol 38 (Part 1, No. 4B) ◽  
pp. 2496-2500 ◽  
Author(s):  
Tran Ngoc Duyet ◽  
Hiroki Ishikuro ◽  
Yi Shi ◽  
Makoto Takamiya ◽  
Takuya Saraya ◽  
...  
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