Measurement of Energetic and Lateral Distribution of Interface State Density in Fully-Depleted Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
1999 ◽
Vol 38
(Part 1, No. 4B)
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pp. 2496-2500
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Keyword(s):
1992 ◽
Vol 31
(Part 1, No. 9A)
◽
pp. 2678-2681
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2012 ◽
Vol 51
(2R)
◽
pp. 024106
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2008 ◽
Vol 47
(4)
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pp. 2668-2671
◽
2010 ◽
Vol 49
(7)
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pp. 074304
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2012 ◽
Vol 51
(2R)
◽
pp. 024301
◽
2006 ◽
Vol 45
(4B)
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pp. 3110-3116
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2012 ◽
Vol 51
◽
pp. 024106
◽