Effect of Ar+Ion Bombardment During Hydrogenated Amorphous Silicon Film Growth in Plasma Chemical Vapor Deposition System

2000 ◽  
Vol 39 (Part 1, No. 11) ◽  
pp. 6404-6409 ◽  
Author(s):  
Isamu Kato ◽  
Yuuki Nakano ◽  
Nobuhiko Yamaguchi
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