Analysis of Back-Gate Voltage Dependence of Threshold Voltage of Thin Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistor and Its Application to Si Single-Electron Transistor
2004 ◽
Vol 43
(4B)
◽
pp. 2036-2040
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2006 ◽
Vol 45
(4B)
◽
pp. 3074-3078
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2008 ◽
Vol 47
(11)
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pp. 8311-8316
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2003 ◽
Vol 20
(5)
◽
pp. 767-769
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2018 ◽
Vol 57
(4S)
◽
pp. 04FD19
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