Analysis of Back-Gate Voltage Dependence of Threshold Voltage of Thin Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistor and Its Application to Si Single-Electron Transistor

2004 ◽  
Vol 43 (4B) ◽  
pp. 2036-2040 ◽  
Author(s):  
Seiji Horiguchi ◽  
Akira Fujiwara ◽  
Hiroshi Inokawa ◽  
Yasuo Takahashi
2003 ◽  
Vol 93 (2) ◽  
pp. 1230-1240 ◽  
Author(s):  
M. D. Croitoru ◽  
V. N. Gladilin ◽  
V. M. Fomin ◽  
J. T. Devreese ◽  
W. Magnus ◽  
...  

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