Highly Precise Atomic Force Microscope Measurement of High-Aspect Nanostructure Free of Probe Bending Error
2004 ◽
Vol 43
(6A)
◽
pp. 3572-3575
◽
2013 ◽
Vol 378
◽
pp. 466-471
1992 ◽
Vol 50
(2)
◽
pp. 1146-1147
1989 ◽
Vol 47
◽
pp. 32-33
1993 ◽
Vol 51
◽
pp. 704-705
2004 ◽
Vol 28
(3)
◽
pp. 301-304
◽
2015 ◽
Vol 6
(3)
◽
pp. 179-191
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