High Electron Mobility Transistors Yield Improvement with Ultrasonically Assisted Recess for High-Speed Integrated Circuits
2006 ◽
Vol 45
(4B)
◽
pp. 3376-3379
◽
1983 ◽
Vol 30
(11)
◽
pp. 1569-1569
◽
1992 ◽
Vol 4
(9)
◽
pp. 1012-1014
◽
1993 ◽
Vol 11
(6)
◽
pp. 2244
◽
1983 ◽
Vol 22
(Part 2, No. 2)
◽
pp. L82-L84
◽
1985 ◽
Vol 6
(2)
◽
pp. 81-82
◽
2011 ◽
Vol 1
(1)
◽
pp. 25-32
◽