Deposition-Temperature Effect on Nitride Trapping Layer of Silicon–Oxide–Nitride–Oxide–Silicon Memory
2007 ◽
Vol 46
(5A)
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pp. 2827-2830
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2006 ◽
Vol 37
(2)
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pp. 173-177
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2005 ◽
Vol 106
(3)
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pp. 319-328
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2008 ◽
Vol 52
(6)
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pp. 844-848
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2004 ◽
Vol 48
(10-11)
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pp. 1771-1775
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2015 ◽
Vol 15
(12)
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pp. 7234-7241
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2011 ◽
Vol 11
(8)
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pp. 7512-7515
Keyword(s):
2018 ◽
Vol 35
(7)
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pp. 078502
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