Deposition-Temperature Effect on Nitride Trapping Layer of Silicon–Oxide–Nitride–Oxide–Silicon Memory

2007 ◽  
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pp. 2827-2830 ◽  
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Chin-Hsing Kao ◽  
Hua-Ching Chien ◽  
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pp. 173-177 ◽  
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X. Yan ◽  
E. Kroke ◽  
R. Riedel ◽  
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G. R. Guimaraes ◽  
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2008 ◽  
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pp. 844-848 ◽  
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2001 ◽  
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pp. 2791-2800 ◽  
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2004 ◽  
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