Study of Medium-Range Order and Defects in Hydrogenated Protocrystalline Silicon Films Deposited by Radio Frequency Plasma Enhanced Chemical Vapor Deposition
2007 ◽
Vol 46
(11)
◽
pp. 7188-7193
◽
2008 ◽
Vol 51
(4)
◽
pp. 371-377
◽
2010 ◽
Vol 49
(8)
◽
pp. 081402
◽
2016 ◽
Vol 55
(8)
◽
pp. 089203
◽
Keyword(s):
2012 ◽
Vol 22
(4)
◽
pp. 190-193
◽
1997 ◽
Vol 36
(Part 1, No. 5A)
◽
pp. 2817-2821
◽
2007 ◽
Vol 16
(2)
◽
pp. 196-201
◽
2011 ◽
Vol 257
(23)
◽
pp. 9717-9723
◽