Performance and Reliability Improvement of HfSiON Field-Effect Transistor with Low Hafnium Concentration Cap Layer Formed by Metal Organic Chemical Vapor Deposition with Diethylsilane

2008 ◽  
Vol 47 (2) ◽  
pp. 879-884 ◽  
Author(s):  
Motoyuki Sato ◽  
Yasushi Nakasaki ◽  
Koji Watanabe ◽  
Tomonori Aoyama ◽  
Eiji Hasegawa ◽  
...  
2021 ◽  
Vol 15 (6) ◽  
pp. 2170024
Author(s):  
Yuxuan Zhang ◽  
Zhaoying Chen ◽  
Kaitian Zhang ◽  
Zixuan Feng ◽  
Hongping Zhao

Sign in / Sign up

Export Citation Format

Share Document