Investigation of Thermal Stability of TiN Film Formed by Atomic Layer Deposition Using Tetrakis(dimethylamino)titanium Precursor for Metal-Gate Metal–Oxide–Semiconductor Field-Effect Transistor

2010 ◽  
Vol 49 (4) ◽  
pp. 04DA16 ◽  
Author(s):  
Tetsuro Hayashida ◽  
Kazuhiko Endo ◽  
Yongxun Liu ◽  
Takahiro Kamei ◽  
Takashi Matsukawa ◽  
...  
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