Investigation of Thermal Stability of TiN Film Formed by Atomic Layer Deposition Using Tetrakis(dimethylamino)titanium Precursor for Metal-Gate Metal–Oxide–Semiconductor Field-Effect Transistor
2010 ◽
Vol 49
(4)
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pp. 04DA16
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2011 ◽
Vol 51
(1)
◽
pp. 011101
◽
2011 ◽
Vol 29
(3)
◽
pp. 032203
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