Structural Study of Tin‐Doped Indium Oxide Thin Films Using X‐Ray Absorption Spectroscopy and X‐Ray Diffraction: I . Description of the Indium Site

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Precise determination of structure of CoN has been achieved combining x-ray diffraction, x-ray absorption spectroscopy measurements and theoretical simulations both at Co and N K-edges and magnetization measurements.<br>


1993 ◽  
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A.M. Flank ◽  
E. Philippot

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