Structural properties of low-temperature grown ZnO thin films determined by X-ray diffraction and X-ray absorption spectroscopy

2011 ◽  
Vol 519 (13) ◽  
pp. 4366-4370 ◽  
Author(s):  
Chung-Jong Yu ◽  
Nark-Eon Sung ◽  
Han-Koo Lee ◽  
Hyun-Joon Shin ◽  
Young-Duck Yun ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Structural Properties ◽  
Absorption Spectroscopy ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

X-Ray Absorption Spectroscopy Study of Copper Doped ZnO Thin Films

2007 ◽  
Author(s):  
Qing Ma ◽  
D. B. Buchholz ◽  
Mark Anderson ◽  
Larry Aagesen ◽  
R. P. H. Chang
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Zno Thin Films ◽  
Spectroscopy Study ◽  
X Ray ◽  
Doped Zno ◽  
X Ray Absorption

scholarly journals Study of Structural Properties of Annealed Cdo and Zno Thin Films

2017 ◽  
Vol 14 (2) ◽  
pp. 164-168
Author(s):  
Kishor Hurde ◽  
A. B. Lad
Keyword(s):  
Thin Films ◽  
Structural Properties ◽  
Thermal Annealing ◽  
Diffraction Data ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transparent Conducting ◽  
Resistance To Oxidation

The CdO and ZnO are n- type semiconductors are transparent conducting in nature, inexpensive, mechanically stable and highly resistance to oxidation. In the present work these films have been obtained from thermal annealing of chemically deposited CdS and ZnS thin films. The structural properties of chemically deposited CdS and ZnS thin films and thermally annealed CdO and ZnO thin films have been studied. From x-ray diffraction data it is observed that annealing of the thin films at a particular temperature enhance the structural properties.

Effect of R.F Power to the Properties of ZnO Thin Films Deposited by Magnetron Sputtering

2011 ◽  
Vol 364 ◽  
pp. 119-123 ◽  
Author(s):  
Nor Diyana Md Sin ◽  
M.Z. Musa ◽  
Mohamad Rusop
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Structural Properties ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
Absorption Properties ◽  
X Ray ◽  
Atomic Force ◽  
Current Voltage ◽  
Pure Argon Atmosphere

The effect of radio frequency (R.F) power to the properties of zinc oxide (ZnO) thin films deposited by magnetron sputtering is presented. This project has been focused on electrical, optical and structural properties of ZnO thin films. The effect of variation R.F power at 100 watt ~ 400 watt on the ZnO thin films has been investigated. The thin films were examined using current-voltage (I-V) measurement, UV-Vis-NIR spectrophotometer, x-ray diffraction (XRD) and atomic force microscope (AFM). ZnO thin films were prepared at room temperature in pure argon atmosphere by a R.F magnetron sputtering using ZnO target. I-V measurement indicates that at 300 watt R.F power show the highest conductivity. All films have showed high UV absorption properties using UV-VIS spectrophotometer (JASCO 670). Highly oriented ZnO thin films [002] direction was obtained by using Rigaku Ultima IV. The root means square (rms) roughness for ZnO thin film were about (<2nm) was measured using AFM (Park System XE-100). Keywords-ZnO thin films, R.F power, electrical properties, optical properties, structural properties

Study of Structural & Magnetic Properties of CoN Thin Films

2019 ◽  
Author(s):  
Mukul Gupta ◽  
Yogesh Kumar ◽  
Nidhi Pandey ◽  
Akhil Tayal ◽  
Wolfgang Caliebe ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Absorption Spectroscopy ◽  
Precise Determination ◽  
X Ray Diffraction ◽  
Magnetization Measurements ◽  
X Ray ◽  
X Ray Absorption ◽  
Theoretical Simulations

Precise determination of structure of CoN has been achieved combining x-ray diffraction, x-ray absorption spectroscopy measurements and theoretical simulations both at Co and N K-edges and magnetization measurements.<br>

Probing local structure of co doped polyvinylidene fluoride-ZnO thin films using X-ray absorption spectroscopy

2017 ◽  
Vol 131 ◽  
pp. 115-123 ◽  
Author(s):  
Rajkumar Dey ◽  
Ashok Kumar Yadav ◽  
Ritamay Bhunia ◽  
Shambhu Nath Jha ◽  
Dibyendu Bhattacharyya ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Local Structure ◽  
Polyvinylidene Fluoride ◽  
Zno Thin Films ◽  
X Ray ◽  
X Ray Absorption ◽  
Co Doped

scholarly journals X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique

AIP Advances ◽  
2015 ◽  
Vol 5 (11) ◽  
pp. 117138 ◽  
Author(s):  
Ashok Kumar Yadav ◽  
Sk Maidul Haque ◽  
Dinesh Shukla ◽  
Ram Janay Choudhary ◽  
S. N. Jha ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Rf Sputtering ◽  
Zno Thin Films ◽  
X Ray ◽  
Doped Zno ◽  
X Ray Absorption ◽  
Mn Doped

Study of Structural & Magnetic Properties of CoN Thin Films

2019 ◽  
Author(s):  
Mukul Gupta ◽  
Yogesh Kumar ◽  
Nidhi Pandey ◽  
Akhil Tayal ◽  
Wolfgang Caliebe ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Absorption Spectroscopy ◽  
Precise Determination ◽  
X Ray Diffraction ◽  
Magnetization Measurements ◽  
X Ray ◽  
X Ray Absorption ◽  
Theoretical Simulations

Precise determination of structure of CoN has been achieved combining x-ray diffraction, x-ray absorption spectroscopy measurements and theoretical simulations both at Co and N K-edges and magnetization measurements.<br>

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