Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices

Scanning Probe ◽

Probe Microscopy ◽

Nanoelectronic Devices ◽

Application of Scanning Probe Microscopy Techniques for Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices

ECS Meeting Abstracts ◽

10.1149/ma2007-02/19/1093 ◽

2007 ◽

Keyword(s):

Carbon Nanotubes ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoelectronic Devices ◽

Structural and Electrical Characterization of Dielectrics, Carbon Nanotubes and Nanoelectronic Devices by Means of Scanning Probe Microscopy

ECS Transactions ◽

10.1149/1.2773983 ◽

2019 ◽

Vol 10 (1) ◽

pp. 129-140

Author(s):

Udo Schwalke

Keyword(s):

Carbon Nanotubes ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoelectronic Devices

Electrical characterization of semiconductor nanowires by scanning-probe microscopy

Semiconductor Nanowires ◽

10.1016/b978-1-78242-253-2.00010-4 ◽

2015 ◽

pp. 277-304 ◽

Cited By ~ 2

Author(s):

T. Xu ◽

B. Grandidier

Keyword(s):

Semiconductor Nanowires ◽

Scanning Probe ◽

Electrical characterization of semiconductor materials and devices using scanning probe microscopy

Materials Science in Semiconductor Processing ◽

10.1016/s1369-8001(00)00174-8 ◽

2001 ◽

Vol 4 (1-3) ◽

pp. 71-76 ◽

Cited By ~ 36

Author(s):

P. De Wolf ◽

E. Brazel ◽

A. Erickson

Keyword(s):

Scanning Probe ◽

Semiconductor Materials ◽

Combination of scanning probe microscopy techniques for evaluating the electrical parameters of individual multiwalled carbon nanotubes

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/256/1/012018 ◽

2017 ◽

Vol 256 ◽

pp. 012018 ◽

Cited By ~ 1

Author(s):

D V Sokolov ◽

N A Davletkildeev ◽

V V Bolotov ◽

I A Lobov

Keyword(s):

Carbon Nanotubes ◽

Multiwalled Carbon Nanotubes ◽

Scanning Probe ◽

Electrical Parameters ◽

Multiwalled Carbon ◽

Probe Microscopy ◽

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 - NanoScience and Technology ◽

Electrical Characterization of Solar Cell Materials Using Scanning Probe Microscopy

10.1007/978-3-642-25414-7_19 ◽

2012 ◽

pp. 551-573 ◽

Cited By ~ 3

Author(s):

Stefan A. L. Weber ◽

Hans-Jürgen Butt ◽

Rüdiger Berger

Keyword(s):

Solar Cell ◽

Scanning Probe ◽

Nanoscale characterization of solid electrolyte by Scanning Probe Microscopy techniques

Electrochimica Acta ◽

10.1016/j.electacta.2019.135553 ◽

2020 ◽

Vol 334 ◽

pp. 135553 ◽

Cited By ~ 2

Author(s):

Zhongting Wang ◽

Masashi Kotobuki ◽

Li Lu ◽

Kaiyang Zeng

Keyword(s):

Solid Electrolyte ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Electrical Scanning Probe Microscopy Techniques for the Detailed Characterization of High-k Dielectric Layers

ECS Meeting Abstracts ◽

10.1149/ma2010-01/18/986 ◽

2010 ◽

Keyword(s):

Scanning Probe ◽

Detailed Characterization ◽

Probe Microscopy ◽

Dielectric Layers ◽

High K ◽

High K Dielectric ◽

Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films

Microelectronics Reliability ◽

10.1016/j.microrel.2013.07.086 ◽

2013 ◽

Vol 53 (9-11) ◽

pp. 1430-1433 ◽

Cited By ~ 2

Author(s):

Alexander Hofer ◽

Roland Biberger ◽

Günther Benstetter ◽

Björn Wilke ◽

Holger Göbel

Keyword(s):

Organic Semiconductor ◽

Scanning Probe ◽

Semiconductor Films ◽

Nanoscale characterization of CH 3 -terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

Applied Surface Science ◽

10.1016/j.apsusc.2015.08.182 ◽

2015 ◽

Vol 356 ◽

pp. 921-926 ◽

Cited By ~ 3

Author(s):

Tobias Berthold ◽

Guenther Benstetter ◽

Werner Frammelsberger ◽

Rosana Rodríguez ◽

Montserrat Nafría

Keyword(s):

Scanning Probe ◽

Self Assembled Monolayer ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Self Assembled ◽