Evaluation of Ionomer Distribution on Electrocatalysts for Polymer Electrolyte Fuel Cells by Use of a Low Acceleration Voltage Scanning Electron Microscope

2021 ◽  
Author(s):  
Katsuyoshi Kakinuma ◽  
Masako Kawamoto ◽  
Kayoko Tamoto ◽  
Miho Yamaguchi ◽  
Satoru Honmura ◽  
...  
Keyword(s):  
Fuel Cells ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Polymer Electrolyte ◽  
Polymer Electrolyte Fuel Cells ◽  
Acceleration Voltage ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic Domain Observation of an Amorphous Fe-Si-B Ribbon by Means of a High Voltage Scanning Electron Microscope

1981 ◽  
Vol 39 ◽  
pp. 320-321
Author(s):  
K. Tsuno ◽  
Y. Harada ◽  
T. Sato
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Voltage ◽  
Amorphous Ribbon ◽  
Image Resolution ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Scattered Electron ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic domains of ferromagnetic amorphous ribbon have been observed using Bitter powder method. However, the domains of amorphous ribbon are very complicated and the surface of ribbon is not flat, so that clear domain image has not been obtained. It has been desired to observe more clear image in order to analyze the domain structure of this zero magnetocrystalline anisotropy material. So, we tried to observe magnetic domains by means of a back-scattered electron mode of high voltage scanning electron microscope (HVSEM).HVSEM method has several advantages compared with the ordinary methods for observing domains: (1) high contrast (0.9, 1.5 and 5% at 50, 100 and 200 kV) (2) high penetration depth of electrons (0.2, 1.5 and 8 μm at 50, 100 and 200 kV). However, image resolution of previous HVSEM was quite low (maximum magnification was less than 100x), because the objective lens cannot be excited for avoiding the application of magnetic field on the specimen.

Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer

2019 ◽  
Vol 26 (4) ◽  
pp. 758-767 ◽  
Author(s):  
Yusuke Sakuda ◽  
Shunsuke Asahina ◽  
Takanari Togashi ◽  
Osamu Terasaki ◽  
Masato Kurihara
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Auger Electron ◽  
Low Voltage ◽  
Image Contrast ◽  
Electron Spectrometer ◽  
Voltage Scanning ◽  
Scanning Electron

Abstract

In Situ Observations of Voiding in Metal Lines Under Passivation

1994 ◽  
Vol 338 ◽  
Author(s):  
T. Marieb ◽  
J.C. Bravman ◽  
P. Flinn ◽  
M. Madden
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Time Lapse ◽  
Still Images ◽  
In Situ Observations ◽  
Voltage Scanning ◽  
Morphology Changes ◽  
Passivated Metal ◽  
Scanning Electron

ABSTRACTMovies showing high voltage scanning electron microscope (HVSEM) in situ observations of void motion in passivated metal lines were produced. By taking pictures of the line when the void morphology changes and combining these images digitally with a technique called morphing, a time-lapse movie is constructed with the minimum amount of stored images. The sequence of still images from which a movie is constructed are shown in this paper. This sequence demonstrates that wedge voids do not cause failure in near-bamboo pure Al lines; rather the void will move until it encounters a grain which it can grow across in a slit-like manner.

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