Crystallinity Evaluation of Low Temperature Polycrystalline Silicon Thin Film Using UV/Visible Raman Spectroscopy

2016 ◽  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Low Temperature ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Uv Visible

Crystallinity Evaluation of Low Temperature Polycrystalline Silicon Thin Film Using UV/Visible Raman Spectroscopy

2016 ◽  
Vol 72 (4) ◽  
pp. 249-255 ◽  
Author(s):  
R. Yokogawa ◽  
K. Takahashi ◽  
K. Komori ◽  
Y. Hirota ◽  
N. Sawamoto ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Low Temperature ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Uv Visible

Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

2007 ◽  
Vol 46 (7A) ◽  
pp. 4021-4027 ◽  
Author(s):  
Hitoshi Ueno ◽  
Yuta Sugawara ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Gate Oxide ◽  
Silicon Thin Film

3.5-Inch QCIF AMOLED Panels with Ultra-low-Temperature Polycrystalline Silicon Thin Film Transistor on Plastic Substrate

ETRI Journal ◽  
2008 ◽  
Vol 30 (2) ◽  
pp. 308-314 ◽  
Author(s):  
Yong-Hae Kim ◽  
Choong-Heui Chung ◽  
Jaehyun Moon ◽  
Su-Jae Lee ◽  
Gi Heon Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Polycrystalline Silicon ◽  
Thin Film Transistor ◽  
Plastic Substrate ◽  
Silicon Thin Film
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