On-Site Determination of Ash in Coal Utilizing a Portable XRF Analyzer

1979 ◽  
Vol 23 ◽  
pp. 57-63
Author(s):  
F. V. Brown ◽  
S. A. Jones

The x-ray system used was a Columbia Scientific Industries Corporation Portable X-Ray Fluorescence Analyzer Minilab 700 with a ten millicurie curium 244 source. This source was chosen instead of the available 30mCi Pu-238 or the 30mCi Cm-244 source because it could be supplied under a general radioactivity materials license. The XRF analyzer could be powered by a variety of power supplies, either AC or DC. All data were evaluated and best curves were selected utilizing the Honeywell Time Sharing System. Programs from the statistical library were used with minor modifications.

1971 ◽  
Vol 15 ◽  
pp. 114-122 ◽  
Author(s):  
Annin Segmüller

An IBM 1800 time-sharing system is used in our X-ray laboratory to control a four-circle diffractometer for structure research, several powder diffractometers, a pole-figure goniometer and a microdensitometer along with other instruments outside the diffraction area. A survey of the computer system is given and the hardware necessary to automate the diffractometers is discussed. The computer supervision ranges from simple data-logging with a minimum of control to complete control of all actions depending on the diffractometer and the requirements of the experiment. Also described is the use of the computer to process the data and to perform background jobs.


1971 ◽  
Vol 15 ◽  
pp. 70-89
Author(s):  
Melvin H. Mueller

The use of on-line computers for control and acquisition of data from x-ray and neutron diffractometers has continuously improved and expanded. Systems vary from a small 4K core computer to a time-sharing system with a medium or large computer. The choice of a single time-shared computer or an individual standalone system must be based on one's own particular environment. As large high-speed electronic computers became available, increasingly complex chemical and magnetic structures have been analysed and solved; this has created a demand for rapid, reliable, and versatile means of obtaining diffraction data. Since small computers have been developed at reduced cost and with increased storage capacity, they must be considered for use in diffraction experimentation. Therefore, in x-ray and neutron scattering, small computers are needed for data acquisition and large computers are needed for data analysis.


1994 ◽  
Vol 35 (4) ◽  
pp. 391-395 ◽  
Author(s):  
S. Lundqvist ◽  
S.-O. Hietala ◽  
C. Berglund ◽  
K. Karp

The total plasma clearance of iohexol at urography and 51Cr-EDTA was compared in 31 patients with di- or tetraparesis. A reference 51Cr-EDTA clearance was also performed 24 hours prior to the urography. The GFR was calculated from one, 2 or 4 plasma samples collected 180, 210, 240 and 270 min after the injection. An X-ray fluorescence analyzer was used for the analysis of iohexol in plasma as well as the contrast medium clearance calculations. It was shown that single or multiple sample clearance of iohexol and 51Cr-EDTA were equivalent methods for measurement of the GFR. The GFR was not affected by iohexol in a dose routinely used for urography. It was concluded that the patient comfort is improved if 51Cr-EDTA clearance is replaced by contrast medium clearance in association with urography.


Cybernetics ◽  
1966 ◽  
Vol 1 (5) ◽  
pp. 28-30
Author(s):  
L. A. Kalinichenko

2021 ◽  
Vol 87 (6) ◽  
pp. 14-19
Author(s):  
A. A. Drozdov ◽  
M. N. Andreev ◽  
D. S. Ratnikov ◽  
E. D. Bychkov

A method for the determination of the glass composition in the systems PbO – SiO2 and K2O – PbO – SiO2 with different additives present both in historical and modern art glass is considered. Development of a non-destructive method for determining the glass composition in conditions of museum storage is an important goal for museum practice. We propose a method for determining the composition of those glasses using a portable X-ray fluorescence analyzer (XRF). To select the optimal software suitable for measurements, we have synthesized a number of standard glass samples with the composition determined by ICP-AES. A glass sample of was dissolved in an autoclave in a mixture of nitric, hydrofluoric, and perchloric acids. The lead content in standard samples was simultaneously determined gravimetrically after fusion of the sample with sodium carbonate. Using XRF measurements of standard samples we development of a method for determination of the glass composition with an accuracy sufficient to assign the glass to one of the groups of historical glasses. The results obtained can be used for attribution of lead glass products. The content of potassium oxide in historical samples was estimated by XRF method using two independent programs with subsequent averaging of the data obtained. When using our method, the error of potassium, silicon and lead determination does not exceed 10%, which is sufficient for a museum description and attribution of an item. The developed procedure was tested in analysis of the items from the collection of the State Museum of Ceramics («Kuskovo Estate of the 18th century»).


1993 ◽  
Vol 37 ◽  
pp. 1-6
Author(s):  
Ron Jenkins

In these modern times, where the use of the computer in the analytical laboratory is taken for granted, it is perhaps difficult to realize that, less than one generation ago, computers were little more than an idea on an engineer's desk. It is interesting to note the sequence in which the automation of data collection and data processing developed. As would be expected, the time sequence followed closely the developments in computer hardware and peripherals. An important factor in the development of most commercial automated systems was the “20%” rule. This rule required that the total cost of any computer package should not exceed 20% of the sale price of the final automated product. Rex's “Numerical Control Powder Diffractometer” was described in the 1966 Denver Conference and this machine was to be the forerunner of a whole host of automated diffractometers which appeared in the early 1970s. Typical systems used either a 4K minicomputer or a time-sharing system with a large main-frame computer. It is interesting to observe that, as we come into the 1990s, the argument as to whether the main-frame will survive as a viable alternative to the rapidly developing PC still goes on.


1968 ◽  
Vol 12 ◽  
pp. 404-417 ◽  
Author(s):  
C. Richard Desper

AbstractThe Picker Four-Angle Computer System (FACS-1), a computercontrolled x-ray diffractometer originally designed for single crystal studies, has been adapted for use with polycrystalline samples. The system is controlled by a PDP-8S, a small time-sharing computer with teletype input and output. Programs have been written to take advantage of the high degree of flexibility inherent in online computer control. Four basic operations are possible: (a) simple 2θ step-scanning with variable step width; (b) 2θ stepscanning with randomization of orientation; (c) determination of Legendre expansion coefficients for oriented specimens; and (d) determination of pole figures. In operation (a), data is gathered at a series of 2θ values at a prefixed count and/or time. In (b), the sample is rotated to average out orientation, giving the “randomized” intensity (2θ) at various 2θ values. The on-line computer reads the scaler and timer every two degrees of x rotation and forms the appropriate integrals for calculating (2θ) as the sample rotates. Operation (c) is an extension of (b): not only is (2θ) determined, but also various moments of the orientation distribution of the form , where Pn is the nth order Legendre polynomial. Operation (d) may be used to measure pole figures of sheet specimens in reflection or transmission, or of fibers or small particles. Optional modes of operation allow for (a) use of the Ross “balanced filter” technique; (b) integration across diffraction peaks by continuous scanning in 2θ, with background correction; and (c) application of absorption corrections.


2009 ◽  
Vol 92 (2) ◽  
pp. 502-510 ◽  
Author(s):  
David L Anderson

Abstract A field-portable X-ray fluorescence analyzer, factory-calibrated for soil analysis, was used to measure bromine (Br) mass fractions in reference materials, flour, bakery products, malted barley, selected U.S. Food and Drug Administration Total Diet Study foods, and other food products. By using a calibration based on instrumental neutron activation analysis results for Br in reference materials, accurate quantitative results, confirmed by z-scores, could be obtained for mass fractions of about 255 mg/kg. These results confirmed accuracy of results (with larger uncertainties) obtained by applying a simple correction factor to the analyzer's output value. Results showed that very short analysis times (<2 min) would be needed to screen foods for Br content at regulatory levels for brominated and enriched brominated flour (24 mg/kg Br) and whole wheat flour and bakery products (36 mg/kg Br). Feasibility for determination of Br in malted barley at the regulatory level (75 mg/kg Br) was demonstrated, but quantitative results at that level could not be assured because no reference material with a suitable mass fraction was available. Br mass fractions for all foods tested were well below regulatory levels.


2020 ◽  
Vol 20 (4) ◽  
pp. 1011-1018
Author(s):  
ANTOANETA ENE ◽  
FLORIN SLOATA

This paper refers to the application of XRF method for the simultaneous determination of arsenic and selected metals from waste samples resulted from the dismanlting of distilleries in the perimeter of Azomures S.A., Mures County, Romania. The dismantling operation was carried out by a specialized Romanian company, and from this operation resulted several refractory construction wastes, such as sands with a very high content of arsenic and its chemical compounds. In order to determine the arsenic and other metals concentration, the energy-dispersive X-ray fluorescence (ED-XRF) spectrometric technique was employed. Application of the ED-XRF method was performed in an accredited laboratory for the determination of toxic substances from various samples, using a Genius portable XRF (p-XRF) spectrometer manufactured by Skyray Instruments Inc.


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