A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis

1980 ◽  
Vol 24 ◽  
pp. 407-412 ◽  
Author(s):  
T. C. Huang ◽  
W. Parrish ◽  
G. L. Ayers
Keyword(s):  
High Speed ◽  
Fluorescence Analysis ◽  
Second Order ◽  
Computer Method ◽  
Spectral Lines ◽  
Energy Dispersive ◽  
X Ray ◽  
Xrf Analysis ◽  
Speed Computer ◽  
Better Than

AbstractThis paper describes a computer method for wavelength dispersive (WD) qualitative X-ray fluorescence (XRF) analysis. It determines the elements, spectral lines, wavelengths, reflection angles and peak intensities of the first and second order reflections in less than half a minute of time using an IBM Series/1 minicomputer. The resolution and precision are significantly better than the energy dispersive (ED) method and when combined with high speed computer recording the speed is comparable.

The Fast Analysis of Uranium Ore by EDXRF

1979 ◽  
Vol 23 ◽  
pp. 81-86
Author(s):  
Ronald A. Vane ◽  
William D. Stewart ◽  
Mike Barker
Keyword(s):  
High Speed ◽  
Energy Dispersive ◽  
Fast Analysis ◽  
X Ray ◽  
Uranium Ore ◽  
High Speed Analysis ◽  
Wet Chemical ◽  
Better Than ◽  
Good Agreement

AbstractEnergy dispersive X-ray fluorescence (EDXRF) spectrometry has been applied to the high speed analysis of uranium ore for the purpose of grading and sorting truckloads of ore at the mine. The system is able to analyze uranium ore in less than 60 seconds with uranium levels ranging from < 0.005% to > 5% U3O8. Precision at the 2σ level for 200 ppm ore is better than 10% relative. Good agreement is obtained with wet chemical results in a large variety of rock matrices.

The Recessed Source Geometry for Source Excited X-Ray Fluorescence Analysis

1985 ◽  
Vol 29 ◽  
pp. 545-550 ◽  
Author(s):  
C. A. N. Conde ◽  
J. M. F. dos Santos
Keyword(s):  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
X Ray ◽  
Edxrf Analysis ◽  
Source Distance ◽  
Source Geometry ◽  
Annular Source ◽  
Better Than

AbstractDifferent geometries are considered for source excited energy-dispersive X-ray fluorescence (EDXRF) analysis Systems, including the recessed source geometry introduced in the present work. The calculated physical excitation-detection efficiencies, for the side (or annular), central, receded and recessed source geometries are presented as a function of the target to source distance, for Ca, K, S and Si targets excited with a Fe-55 XBF-3 X-ray source and xenon filled gas proportional scintillation counters. The last two geometries present in gênerai the highest efficiencies. The recessed source geometry présent the best performance with peak efficiencies a factor of 3.3 better than those for the standard side or annular source geometries.

Use of X-ray Fluorescence Analysis for the Determination of Rare Earth Elements

2016 ◽  
Vol 1 (9) ◽  
Author(s):  
Rainer Schramm
Keyword(s):  
Rare Earth ◽  
Rare Earth Elements ◽  
Fluorescence Analysis ◽  
Solid Material ◽  
Spectral Lines ◽  
Energy Dispersive ◽  
X Ray ◽  
Reference Samples ◽  
Selection Of

AbstractX-ray fluorescence spectrometry (XRF) is a powerful tool for the analysis of solid material. That is the reason why the technique was applied for the determination of rare earth elements (REEs) since about 1970. At present, energy-dispersive XRF and wavelength-dispersive XRF are used for the analysis of pressed powder pellets or fused Li-borate beads containing REEs. The production of reliable results can only be achieved by careful optimization of the parameter, in particular the selection of spectral lines. The quantification is based on a calibration realized by using reference samples.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Energy-Dispersive X-ray Fluorescence Analysis as a Rapid Method for Identifying Tephras

1983 ◽  
Vol 19 (2) ◽  
pp. 201-211 ◽  
Author(s):  
A. B. Cormie ◽  
D. E. Nelson
Keyword(s):  
Reliable Method ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
Bulk Glass ◽  
X Ray ◽  
Additional Tool ◽  
White River ◽  
Routine Identification ◽  
Weathering Effects ◽  
Mount St Helens

AbstractThe use of energy-dispersive X-ray fluorescence analysis (XES) for the routine identification of three tephras (Mazama, Bridge River, Mount St. Helens Yn) commonly found in archeological sites in British Columbia has been investigated. Researchers have often assumed that chemical analysis of bulk samples of glass separates would be hampered by contamination and weathering effects. Our results indicate that XES of bulk glass separates provides a very reliable method for rapidly identifying the three tephras in question, even with a very simple sample preparation. This should enable persons not skilled in geology or in tephrochronology to collect and to identify samples of these tephras. Finally, as a part of the study, similar measurements were made on the separated glass portions of these three tephras and of three others (Glacier Peak B and G, White River) from northwest North America. The results suggest that this method may provide tephrochronologists with a useful additional tool for studying tephras in other regions.

Provenance Study of Venezuelan Pre-Columbian Ceramics Employing Radioisotope X-Ray Fluorescence

1988 ◽  
Vol 42 (8) ◽  
pp. 1482-1487 ◽  
Author(s):  
J. J. Labrecque ◽  
J. E. Vaz ◽  
K. Tarble ◽  
P. A. Rosales
Keyword(s):  
Source Area ◽  
Fluorescence Analysis ◽  
Archaeological Sites ◽  
Provenance Study ◽  
Archaeological Ceramics ◽  
X Ray ◽  
Provenance Studies ◽  
Better Than

Radioisotope x-ray fluorescence analysis was performed to determine normalized elemental intensities for pre-Columbian sherds and roller stamps from different archaeological sites in the Middle Orinoco region of Venezuela. These normalized intensities were used to construct three-component (Triangle) graphs separating the sherds into three groups based on their known origin. The three-component graphs were: (Zn, Sr, Zr), (Rb, Sr, Zr), and ( A, Sr, Zr), where A = Cu + Zn + Pb normalized intensities. The total precision was shown to be better than 5% absolute for all cases studied. It was concluded that two of the roller stamps found at one site were probably manufactured in a different source area. This lends support to the notion that the roller stamps were a trade item in late pre-Columbian times (1000–1400 A.D.). The method applied in this study using a 109Cd (2 mCi) source seems to be appropriate for provenance studies of archaeological ceramics where many samples are processed, because it has the inherent advantages of being simple, economical, and rapid.

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