Line Broadening Studies on Highly Defective TiO2 Produced by High Pressure Shock Loading

1983 ◽  
Vol 27 ◽  
pp. 379-388
Author(s):  
B. Morosin ◽  
E. J. Graeber ◽  
R. A. Graham
Keyword(s):  
High Pressure ◽  
Catalytic Activity ◽  
Crystallite Size ◽  
Shock Loading ◽  
Lattice Strain ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Large Numbers

Enhanced solid state reactivity of materials both during and after shock compression has been attributed to the introduction of large numbers of defects into the crystalline lattices and to reduction in the particle and crystallite size of powders [1]. In particular, orders of magnitude increases in the catalytic activity has been observed In shock-modified TiO2 [2]. Line broadening of x-ray diffraction profiles provides a means to determine the coherent crystallite size and the residual lattice strain resulting from defect concentrations. The present study on shock-loaded rutile is a detailed Investigation of the influence of shock loading on residual lattice strain and coherent crystallite size. Annealing of shock-modified rutile powders is also studied.

Line Broadening Studies on Highly Defective Al2O3 Produced by High Pressure Shock Loading

1983 ◽  
Vol 27 ◽  
pp. 369-378
Author(s):  
B. Morosin ◽  
E. J. Graeber ◽  
R. A. Graham
Keyword(s):  
Crystallite Size ◽  
Shock Loading ◽  
Lattice Strain ◽  
Powder Materials ◽  
Prior Work ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Large Numbers

Enhanced solid state reactivity of materials both during and after shock compression has been attributed to the introduction of large numbers of defects into the crystalline lattices and to reduction in the particle and crystallite size of powders [1,2]. Line broadening of x-ray diffraction profiles provides a means to determine the residual lattice strain resulting from such defect concentrations as well as a means to determine the coherent crystallite size. Various diffraction studies on shock-loaded powder materials have previously been reported and much of this work primarily by Soviet and Japanese scientists has recently been reviewed [2]. Cohen has reported results on shock-loaded copper [3]. In prior work, however, shock, pressures have not typically been quantified and there are few detailed line broadening investigations of refractory inorganic powders [1,4,5]. The present study on shock-loaded alumina powders is a detailed investigation of the influence of shock loading on residual lattice strain and coherent crystallite size.

scholarly journals X-Ray Line Broadening Studies on Aluminum Nitride, Titanium Carbide and Titanium Diboride Modified by High Pressure Shock Loading

1983 ◽  
Vol 24 ◽  
Author(s):  
B. Morosin ◽  
R. A. Graham
Keyword(s):  
High Pressure ◽  
Shock Loading ◽  
Lattice Strain ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Simplified Method ◽  
Post Shock ◽  
Peak Pressures

ABSTRACTPowders of AlN, TiC and TiB2 have been subjected to controlled shock loading with peak pressures in the samples between 14 to 27 GPa and preserved for post-shock study. Broadened x-ray diffraction peak profiles are analyzed by a simplified method and show increases in residual lattice strain and small decreases in crystallite size. Strain values range from 10−5 to 10−4 for TiB2 and to values larger than 10−3 for TiC and AlN.

X-Ray Line Broadening Study on Shock-Modified Hematite

1987 ◽  
Vol 31 ◽  
pp. 287-294 ◽  
Author(s):  
Y. Zhang ◽  
J. M. Stewart ◽  
B. Morosin ◽  
R. A. Graham ◽  
C. R. Hubbard
Keyword(s):  
Shock Loading ◽  
Lattice Strain ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Shock Temperature ◽  
Crystallite Sizes ◽  
Powder Compacts ◽  
Peak Pressures

AbstractHematite (α-Fe2O3) powder compacts have been subjected to controlled, quantitative high pressure shock loading at peak pressures from 8-27 GPa and preserved for post shook analysis. The broadened x-ray diffraction peak profiles have been analyzed to determine the residual lattice strain and the coherent crystallite sizes. Maximum modification effects are observed near 17 GPa with strain values near 3 x 10-3 and size values near 200 Å suggesting annealing at higher shock pressure, resulting from the higher shock temperature.

X-Ray Diffraction Study of Shock-Modified Tetragonal Phases of SnO2 and MnO2

1992 ◽  
Vol 36 ◽  
pp. 595-601
Author(s):  
P. Newcomer ◽  
B. Morosin ◽  
R. A. Graham
Keyword(s):  
Shock Loading ◽  
Crystal Size ◽  
Lattice Strain ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Coherent Crystal

AbstractX-ray diffraction line-profile analysis on tetragonal forms of SnO2 (cassiterite), MnO2 (pyrolusite), and previously studied TiO2 (rutile), which were subjected to high pressure shock loading, show that residual lattice strain and coherent “crystal” size are a function of shock parameters. An interesting observation on a sample of MnO2 concerns the recovery of cubic Mn2O3 (bixbyite) in the material subjected to 22 GPa, indicating a shock-induced chemical synthesis.

The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera
Keyword(s):  
Crystallite Size ◽  
Original Form ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Variance Method ◽  
The Mean ◽  
Voigt Function

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.

X-Ray Diffraction Analysis on Crystallite Development of Nanostructured Aluminium

2006 ◽  
Vol 118 ◽  
pp. 53-58
Author(s):  
Elisabeth Meijer ◽  
Nicholas Armstrong ◽  
Wing Yiu Yeung
Keyword(s):  
Crystallite Size ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Equal Channel Angular Extrusion ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Integral Breadth ◽  
X Ray ◽  
Heat Treated ◽  
Diffraction Peaks

This study is to investigate the crystallite development in nanostructured aluminium using x-ray line broadening analysis. Nanostructured aluminium was produced by equal channel angular extrusion at room temperature to a total deformation strain of ~17. Samples of the extruded metal were then heat treated at temperatures up to 300oC. High order diffraction peaks were obtained using Mo radiation and the integral breadth was determined. It was found that as the annealing temperature increased, the integral breadth of the peak reflections decreased. By establishing the modified Williamson-Hall plots (integral breadth vs contract factor) after instrumental correction, it was determined that the crystallite size of the metal was maintained ~80 nm at 100oC. As the annealing temperature increased to 200oC, the crystallite size increased to ~118 nm. With increasing annealing temperature, the hardness of the metal decreased from ~60 HV to ~45 HV.

Crystallite size and lattice strain of lithiated spinel material for rechargeable battery by X-ray diffraction peak-broadening analysis

2019 ◽  
Vol 43 (5) ◽  
pp. 1903-1911 ◽  
Author(s):  
Ahmed A. Al-Tabbakh ◽  
Nilgun Karatepe ◽  
Aseel B. Al-Zubaidi ◽  
Aida Benchaabane ◽  
Natheer B. Mahmood
Keyword(s):  
Crystallite Size ◽  
Lattice Strain ◽  
Diffraction Peak ◽  
Rechargeable Battery ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Dislocations, crystallite size, and planar faults in nanocrystalline ceria

2009 ◽  
Vol 24 (3) ◽  
pp. 228-233 ◽  
Author(s):  
S. R. Aghdaee ◽  
V. Soleimanian
Keyword(s):  
Grain Size ◽  
Dislocation Density ◽  
Crystallite Size ◽  
Cerium Oxide ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocrystalline Ceria ◽  
Hall Plot

The modified Williamson–Hall and Warren–Averbach methods were used successfully for analyzing experimentally observed anisotropic X-ray diffraction line broadening and for determining reliable values of crystallite size and dislocation density in cerium oxide. The modified Williamson–Hall plot gives 22.3(2) nm for volume-weighted crystallite size, while the modified Warren–Averbach produces 18.0(2) nm for area-weighted grain size. The dislocation density and effective outer cut-off radius of dislocations obtained from the modified Warren–Averbach method are 1.8(3)×1015 m−2 and 15.5(1) nm, respectively.

X‐Ray Diffraction Analysis of Crystallite Size and Lattice Strain in Tungsten Wire

1962 ◽  
Vol 33 (2) ◽  
pp. 708-712 ◽  
Author(s):  
A. J. Opinsky ◽  
J. L. Orehotsky ◽  
C. W. W. Hoffman
Keyword(s):  
Diffraction Analysis ◽  
Crystallite Size ◽  
Tungsten Wire ◽  
Lattice Strain ◽  
X Ray Diffraction ◽  
X Ray
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