An Analysis of the Effect of Different Instrumental Conditions on the Shapes of X-ray Powder Line Profiles

1994 ◽  
Vol 38 ◽  
pp. 75-82 ◽  
Author(s):  
R. W. Cheary ◽  
J. P. Cline
Keyword(s):  
Reference Material ◽  
Maximum Intensity ◽  
Full Width ◽  
Half Maximum ◽  
Line Profiles ◽  
Powder Specimen ◽  
Divergent Beam ◽  
X Ray ◽  
Half Maximum Intensity ◽  
Soller Slit

Abstract In this investigation we have examined how the full width at half maximum intensity (FWHM) and asymmetry of x-ray powder diffraction line profiles are influenced by the instrumental conditions adopted. Experimental x-ray data has been collected for a matrix of instrumental conditions by systematically varying the divergence slit angle (and the corresponding anti-scatter slit) over the range 0.25° to 1.25°, by using either a 0.05mm or 0.2mm receiving slit, or by removing the diffracted beam Soller slit. The line profile Standard Reference Material, SRM, 660 (LaB6) was used as the powder specimen in that it imparts minimal specimen induced broadening to the diffraction profiles. X-ray data were collected on a conventional, divergent beam, x-ray diffractometer using CuKα radiation. The FWHM of the CuKα1 component can be as low as 0.035°2θ for high resolution conditions, but is normally ∼0.1°2θ at 2θ ≈ 30° for the instrumental conditions adopted in routine diffractometry. Below 2θ = 50°, the divergence slit has a significant effect on the FWHM and is the major cause of the increase in FWHM with decreasing 2θ. Results are presented of the 2θ dependence of FWHM values for each of the instrumental conditions recorded. A general relationship for the 2θ dependence of the FWHM and the asymmetry has been investigated to supersede the inappropriate Cagliotti expression frequently used in x-ray Rietvcld refinement.

Assessment of Fatigue Life for High-Temperature Pipeline Welds by Non-Destructive Method

2006 ◽  
Vol 326-328 ◽  
pp. 497-500
Author(s):  
Keun Bong Yoo ◽  
Hyun Sun Choi ◽  
Eui Hyun Kim ◽  
Sun Young Cho ◽  
Jae Hoon Kim
Keyword(s):  
High Temperature ◽  
Fatigue Life ◽  
Fatigue Damage ◽  
Maximum Intensity ◽  
Life Assessment ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Half Maximum Intensity

The objective of this study is to estimate the feasibility of X-ray diffraction method application for fatigue life assessment of the high-temperature pipeline steel such as main steam pipe, re-heater pipe and header etc. in power plant. In this study, X-ray diffraction tests using various types of specimen simulated low cycle fatigue damage were performed in order to analyze fatigue properties when fatigue damage conditions become various stages such as 1/4, 1/2 and 3/4 of fatigue life, respectively. As a result of X-ray diffraction tests for specimens simulated fatigue damages, we conformed that the variation of the full width at half maximum intensity decreased in proportion to the increase of fatigue life ratio. And also, the ratio of the full width at half maximum intensity due to fatigue damage has linear relationship with fatigue life ratio algebraically. From this relationship, it was suggested that direct expectation of the life consumption rate was feasible.

Numerical conversion between the Pearson VII and pseudo-Voigt functions

2005 ◽  
Vol 38 (5) ◽  
pp. 830-832 ◽  
Author(s):  
Hejing Wang ◽  
Jian Zhou
Keyword(s):  
Numerical Model ◽  
Numerical Solution ◽  
Maximum Intensity ◽  
Full Width ◽  
Half Maximum ◽  
Error Level ◽  
X Ray ◽  
Shape Coefficient ◽  
Integral Width ◽  
Half Maximum Intensity

The shape coefficient of a curve, which is defined as the ratio of its full width at half-maximum intensity to integral width, is a measure of variation in shape. From the definitions of the pseudo-Voigt, Pearson VII and Voigt functions used in X-ray diffractometry, three shape-converting formulae are deduced. Numerical solution helps to establish a numerical model for interconverting the shapes of the pseudo-Voigt, Pearson VII and Voigt functions. Assessment of the error level and some comments on the shape of the pseudo-Voigt and Pearson VII functions are thereby made.

Effect of Slit Width on the Results of Small-Angle X-Ray Diffraction

2012 ◽  
Vol 630 ◽  
pp. 331-334
Author(s):  
Hua Yong Zhang ◽  
Xiao Jian Liu
Keyword(s):  
Mesoporous Materials ◽  
Small Angle ◽  
Peak Height ◽  
Background Intensity ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Soller Slit

X-ray diffraction analysis is a convenient and important route to investigate crystalline materials. With mesoporous materials, Al-SBA-15 as target, the effects of scatter slit, soller slit and receiving slit of Bruker D8 ADVANCE diffractometer on the small-angle diffraction pattern based on information, such as the background intensity, peak height, intensity and full width at half maximum, which provide the evidence for slits selection.

Research on Influence of Diffractometer Slits on XRD Pattern

2013 ◽  
Vol 544 ◽  
pp. 441-444
Author(s):  
Hua Yong Zhang ◽  
Yong Mei Xia ◽  
Xiao Jian Liu ◽  
Tian Duo Li
Keyword(s):  
Peak Height ◽  
Background Intensity ◽  
Powder Materials ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
Crystalline Materials ◽  
X Ray ◽  
Soller Slit

X-ray diffraction analysis is a convenient and important route to investigate crystalline materials. With powder materials, calcium carbonate as target, the effects of scatter slit, soller slit and receiving slit of Bruker D8 ADVANCE diffractometer on the diffraction pattern based on information, such as the background intensity, peak height, intensity and full width at half maximum, which provide the evidence for slits selection.

Temperature-gradient analyzers for non-resonant inelastic X-ray scattering

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Daisuke Ishikawa ◽  
Alfred Q. R. Baron
Keyword(s):  
Temperature Gradient ◽  
Solid Angle ◽  
Dispersion Compensation ◽  
Full Width ◽  
Half Maximum ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
And Performance

The detailed fabrication and performance of the temperature-gradient analyzers that were simulated by Ishikawa & Baron [(2010). J. Synchrotron Rad. 17, 12–24] are described and extended to include both quadratic and 2D gradients. The application of a temperature gradient compensates for geometric contributions to the energy resolution while allowing collection of a large solid angle, ∼50 mrad × 50 mrad, of scattered radiation. In particular, when operating relatively close to backscattering, π/2 − θB = 1.58 mrad, the application of a gradient of 1.32 K per 80 mm improves the measured total resolution from 60 to 25 meV at the full width at half-maximum, while when operating further from backscattering, π/2 − θB = 6.56 mrad, improvement from 330 to 32 meV is observed using a combination of a gradient of 6.2 K per 80 mm and dispersion compensation with a position-sensitive detector. In both cases, the operating energy was 15.8 keV and the incident bandwidth was 22 meV. Notably, the use of a temperature gradient allows a relatively large clearance at the sample, permitting installation of more complicated sample environments.

Evaluation of Railway Rails Suffered from Rolling Contact Fatigue Using X-Ray Generalized cosα Method

2018 ◽  
Vol 941 ◽  
pp. 2378-2383
Author(s):  
Toshihiko Sasaki
Keyword(s):  
Rolling Contact Fatigue ◽  
Contact Fatigue ◽  
Rolling Contact ◽  
Full Width ◽  
Half Maximum ◽  
Diffraction Ring ◽  
X Ray ◽  
Depth Direction

In this study, the diffraction rings were measured point by point all over the head of rail sample which was used in service, and shearing stresses with respect to the depth direction were determined using the generalized cosα method. The full width at half maximum was also estimated from the diffraction ring.

scholarly journals Backward runaway electrons in a subnanosecond air discharge at atmospheric pressure

2015 ◽  
Vol 34 (1) ◽  
pp. 23-30 ◽  
Author(s):  
Victor F. Tarasenko ◽  
Igor' D. Kostyrya ◽  
Dmitry V. Beloplotov
Keyword(s):  
High Voltage ◽  
Atmospheric Pressure ◽  
Exposure Dose ◽  
X Rays ◽  
Runaway Electrons ◽  
Full Width ◽  
Half Maximum ◽  
X Ray ◽  
Grid Cathode ◽  
Air Discharge

AbstractIn the paper, we study the conditions for the generation of backward runaway electrons through a grounded grid cathode in atmospheric pressure air at high-voltage pulses with a full width at half maximum of 1 ns and risetime of 0.3 ns applied to the gap from a SLEP-150 pulser. The study confirms that backward runaway electrons and X-rays do arise near grid cathodes in atmospheric pressure air. It is shown that the current of the backward beam and the X-rays from the gas diode depend differently on the interelectrode distance. The average X-ray exposure dose in a pulse is more than 3.5 mR.

Effects of Sputtering Pressure on (ZnO)x(InN)1-x Crystal Film Growth at 450°C

2018 ◽  
Vol 941 ◽  
pp. 2093-2098
Author(s):  
Naho Itagaki ◽  
Kazuto Takeuchi ◽  
Nanoka Miyahara ◽  
Kouki Imoto ◽  
Hyun Woong Seo ◽  
...  
Keyword(s):  
Film Growth ◽  
Rf Magnetron Sputtering ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Film ◽  
Crystal Films ◽  
Sputtering Pressure

We studied effects of sputtering pressure on growth of (ZnO)x(InN)1-xcrystal films deposited at 450°C by rf magnetron sputtering. Epitaxial growth of (ZnO)x(InN)1-xfilms was realized on single-crystalline ZnO template. X-ray diffraction measurements show that full width at half maximum of the rocking curves from the (101) plane of the films reaches minimum value of 0.11º at 0.5 Pa. The sputtering gas pressure is a key tuning knob for controlling the crystal quality of ZION films.

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