Nonlinearity Measurements Using Alternating Current
1978 ◽
Vol 5
(2)
◽
pp. 91-98
◽
Keyword(s):
The nonlinearity measurement technique described uses an adapted conventional lock-in-amplifier. This technique enables us to measure small nonlinearities over a wide frequency band and is more sensitive than the 1/f noise measurement used to detect non-homogeneous structures in conductors, resistors and semiconductor components. Results illustrating uses of this method are presented for different types of resistor and semiconductor structures.
2018 ◽
Vol 23
(2)
◽
pp. 389-396
◽
2001 ◽
Vol 15
(3)
◽
pp. 223-229
◽
Keyword(s):
2017 ◽
Vol 29
(1)
◽
pp. 015601
◽
1996 ◽
2018 ◽
Vol 19
(1)
◽
pp. 711-717
◽
2017 ◽
Vol 20
(4)
◽
pp. 50-54
1998 ◽
Vol 50
(4)
◽
pp. 397-414
◽
Keyword(s):
2018 ◽
Vol 60
(4)
◽
pp. 1038-1044
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