Bindings of viologen oligomer to monodisperse colloidal silica particles modified with poly(maleic anhydride-styrene) for controlling of surface -potential

1998 ◽  
Vol 6 (3) ◽  
pp. 237-245
Author(s):  
Kohji Yoshinaga ◽  
Mitsuko Koyama ◽  
Hiroyuki Karakawa
1994 ◽  
Vol 346 ◽  
Author(s):  
Song-Yuan Chang ◽  
Lei Liu ◽  
Sanford A. Asher

ABSTRACTA novel synthetic methodology has been developed for preparing monodisperse colloidal silica-cadmium sulfide nanocomposite spheres in the 50 – 300 nm size regime. This methodology uses water-in-oil microemulsions as the reaction medium. Monosize silica colloids are first produced by the controlled hydrolysis of tetraethyl orthosilicate in the micro water droplets of the microemulsion. Cadmium sulfide quantum dots are incorporated into the silica colloids during synthesis by the introductions of Cd2+ and S2- microemulsions. Various morphologies of the nanocomposite are fabricated by controlling the heterogeneous coagulation of CdS and SiO2. Unique high surface area silica particles can be prepared when nitric acid etches out the CdS and leaves behind topologically defined voids. The CdS nanocomposites are new materials useful for non-linear optics, while the high surface area silica particles should have novel applications in areas such as catalysis.


1993 ◽  
Vol 159 (1) ◽  
pp. 150-157 ◽  
Author(s):  
René Nyffenegger ◽  
Christian Quellet ◽  
Jaroslav Ricka

2003 ◽  
Vol 767 ◽  
Author(s):  
Patrice Beaud ◽  
Didier Bouvet ◽  
Pierre Fazan ◽  
Eric Jacquinot ◽  
Hiroyuki Aoki ◽  
...  

AbstractLow-κ/Cu interconnect integration achievement is one of the key issues for the future sub-100 nm technologies. Nowadays, no definitive integration scheme has been reported. Low-κ integration is especially difficult because the trench/via etching and CMP processes can damage its properties. In the present work, we present results on different materials that could be used in such integration. We focused our study on the barrier (Ta/TaN) and on a low-κ material (dense and porous), that is a spin-on-dielectric (SOD) of the methylsilsesquioxane (MSQ) type. CMP slurries were made from monodisperse colloidal silica particles. In a first approach, the slurries compositions mainly differed by their pH and abrasive characteristics. The particle size ranged from 12 to 80 nm, with a pH varying between 2 and 11. The sensitivity of the Ta/TaN and low-κ removal rates will also be reported. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) of the different films were carried out in order to evaluate the impact of CMP on their surface quality. Measurements did not show any surface degradation or/and scratches, and no delamination has been observed. Post-CMP κ value measurements have been carried out to highlight possible damage on the low-ê dielectric materials.


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