An Efficient Fault Detection of FPGA and Memory Using Built-in Self Test [BIST]
2019 ◽
Vol 3
(1)
◽
pp. 38
◽
Keyword(s):
2010 ◽
Vol 39
◽
pp. 220-225
Keyword(s):
2010 ◽
pp. 466-472
Keyword(s):
2009 ◽
Vol 58
(7)
◽
pp. 2300-2315
◽