Fabrication and Characterization of Atomic Force Microscopy-Assisted Normally-Off AlGaN/GaN Heterostructure Field Effect Transistors
2016 ◽
Vol 16
(12)
◽
pp. 12831-12834
2015 ◽
Vol 17
(10)
◽
pp. 6794-6800
◽
2010 ◽
Keyword(s):
Keyword(s):