Image acquisition for trolling-mode atomic force microscopy based on dynamical equations of motion

2020 ◽  
pp. 095440622097755
Author(s):  
Mohammadreza Sajjadi ◽  
Hossein Nejat Pishkenari ◽  
Gholamreza Vossoughi
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Imaging Techniques ◽  
Equations Of Motion ◽  
Horizontal Displacement ◽  
Dynamical Equations ◽  
Force Microscopy ◽  
Atomic Force ◽  
Two Degree Of Freedom ◽  
Mode Atomic Force Microscopy

Trolling mode atomic force microscopy (TR-AFM) can considerably reduce the liquid-resonator interaction forces, and hence, has overcome many imaging problems in liquid environments. This mode increases the quality factor (QF) significantly compared with the conventional AFM operation in liquid; therefore, the duration to reach the steady-state periodic motion of the oscillating probe is relatively high. As a result, utilizing conventional imaging techniques, which are based on measuring the amplitude and phase, are significantly slower when compared to our proposed method. This research presents a high-speed scanning technique based on an estimation law to obtain the topography of various samples utilizing a two-degree-of-freedom model of TR-AFM. The effect of the nanoneedle tip horizontal displacement on the estimation process is investigated, and a solution to compensate for its undesirable effect is also presented.

scholarly journals High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

2017 ◽  
Vol 8 ◽  
pp. 1563-1570 ◽  
Author(s):  
Juan Ren ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Interaction Force ◽  
Dynamic Mode ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mode Tm ◽  
Mode Atomic Force Microscopy

Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.

Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

2012 ◽  
Vol 83 (8) ◽  
pp. 083710 ◽  
Author(s):  
O. D. Payton ◽  
L. Picco ◽  
M. J. Miles ◽  
M. E. Homer ◽  
A. R. Champneys
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Signal To Noise Ratio ◽  
Signal To Noise ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Noise Ratio ◽  
Mode Atomic Force Microscopy

High speed tapping mode atomic force microscopy in liquid using an insulated piezoelectric cantilever

2003 ◽  
Vol 74 (11) ◽  
pp. 4683-4686 ◽  
Author(s):  
B. Rogers ◽  
T. Sulchek ◽  
K. Murray ◽  
D. York ◽  
M. Jones ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Piezoelectric Cantilever ◽  
Mode Atomic Force Microscopy

scholarly journals Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy

2014 ◽  
Vol 13 (6) ◽  
pp. 1257-1265 ◽  
Author(s):  
Kai S. Karvinen ◽  
Michael G. Ruppert ◽  
Kaushik Mahata ◽  
S. O. R. Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Dynamic Mode ◽  
Force Estimation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Dynamic Assembly/Disassembly of Staphylococcus aureus FtsZ Visualized by High-Speed Atomic Force Microscopy

2021 ◽  
Vol 22 (4) ◽  
pp. 1697
Author(s):  
Junso Fujita ◽  
Shogo Sugiyama ◽  
Haruna Terakado ◽  
Maho Miyazaki ◽  
Mayuki Ozawa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Division ◽  
Bacterial Cell ◽  
High Speed ◽  
Process Development ◽  
Imaging Techniques ◽  
Bacterial Cell Division ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dynamic Assembly

FtsZ is a key protein in bacterial cell division and is assembled into filamentous architectures. FtsZ filaments are thought to regulate bacterial cell division and have been investigated using many types of imaging techniques such as atomic force microscopy (AFM), but the time scale of the method was too long to trace the filament formation process. Development of high-speed AFM enables us to achieve sub-second time resolution and visualize the formation and dissociation process of FtsZ filaments. The analysis of the growth and dissociation rates of the C-terminal truncated FtsZ (FtsZt) filaments indicate the net growth and dissociation of FtsZt filaments in the growth and dissociation conditions, respectively. We also analyzed the curvatures of the full-length FtsZ (FtsZf) and FtsZt filaments, and the comparative analysis indicated the straight-shape preference of the FtsZt filaments than those of FtsZf. These findings provide insights into the fundamental dynamic behavior of FtsZ protofilaments and bacterial cell division.

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