Numerical simulation of thermal conductivity of MMCs: effect of thermal interface resistance

2003 ◽  
Vol 19 (8) ◽  
pp. 1107-1114 ◽  
Author(s):  
D. Duschlbauer ◽  
H. J. Böhm ◽  
H. E. Pettermann
Author(s):  
Y. Sungtaek Ju ◽  
Gilhwan Cha

We consider different sources of potential systematic errors in the thermal interface resistance measurements. Sub-continuum heat conduction and spatial non-equilibrium between electrons and phonons in a metal may lead to overestimation of the thermal interface resistance. The use of an erroneous substrate thermal conductivity can also cause significant systematic errors in steady- and quasi-steady state measurements of the thermal interface resistance. Our results highlight an urgent need for new systematic experimental studies to confirm the magnitude of intrinsic thermal interface resistance.


Author(s):  
Amer M. Hamdan ◽  
Aric R. McLanahan ◽  
Robert F. Richards ◽  
Cecilia D. Richards

This work presents the characterization of a thermal interface material consisting of an array of mercury micro droplets deposited on a silicon die. Three arrays were tested, a 40 × 40 array (1600 grid) and two 20 × 20 arrays (400 grid). All arrays were assembled on a 4 × 4 mm2 silicon die. An experimental facility which measures the thermal resistance across the mercury array under steady state conditions is described. The thermal interface resistance of the arrays was characterized as a function of the applied load. A thermal interface resistance as low as 0.253 mm2 K W−1 was measured. A model to predict the thermal resistance of a liquid-metal micro droplet array was developed and compared to the experimental results. The model predicts the deformation of the droplet array under an applied load and then the geometry of the deformed droplets is used to predict the thermal resistance of the array. The contact resistance of the mercury arrays was estimated based on the experimental and model data. An average contact resistance was estimated to be 0.14 mm2 K W−1.


2019 ◽  
Vol 201 ◽  
pp. 160-169
Author(s):  
Murali Gopal Muraleedharan ◽  
Umesh Unnikrishnan ◽  
Asegun Henry ◽  
Vigor Yang

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