Hole‐to‐surface resistivity measurements

Geophysics ◽  
1983 ◽  
Vol 48 (1) ◽  
pp. 87-97 ◽  
Author(s):  
Jeffrey J. Daniels
Keyword(s):  
Electric Field ◽  
Current Source ◽  
Surface Resistivity ◽  
General Nature ◽  
Earth Model ◽  
Geoelectric Section ◽  
Layered Earth ◽  
Resistivity Measurements ◽  
Surface Electric Field ◽  
Drill Holes

Hole‐to‐surface resistivity measurements over a layered volcanic tuff sequence illustrate procedures for gathering, reducing, and interpreting hole‐to‐surface resistivity data. The magnitude and direction of the total surface electric field resulting from a buried current source is calculated from orthogonal potential difference measurements for a grid of closely spaced stations. A contour map of these data provides a detailed map of the distribution of the electric field away from the drill hole. Resistivity anomalies can be enhanced by calculating the difference between apparent resistivities calculated from the total surface electric field and apparent resistivities for a layered earth model. Lateral discontinutities in the geoelectric section are verified by repeating the surface field measurments for current sources in several drill holes. A qualitative interpretation of the anomalous bodies within a layered earth can be made by using a three‐dimensional (3-D) resistivity model in a homogeneous half‐space. The general nature of resistive and conductive bodies causing anomalies away from the source drill holes is determined with the aid of data from several source holes, layered models, and 3-D models.

INTERPRETATION OF BURIED ELECTRODE RESISTIVITY DATA USING A LAYERED EARTH MODEL

Geophysics ◽  
1978 ◽  
Vol 43 (5) ◽  
pp. 988-1001 ◽  
Author(s):  
Jeffrey J. Daniels
Keyword(s):  
Direct Current ◽  
Field Data ◽  
Apparent Resistivity ◽  
Current Source ◽  
Well Logs ◽  
Earth Model ◽  
Layered Earth ◽  
Resistivity Data ◽  
True Resistivity ◽  
Resistivity Logging

The layered earth model is a fundamental interpretation aid for direct current resistivity data. This paper presents a solution for the layered earth problem for a buried current source and a buried receiver. The model is developed for source and receiver electrodes buried anywhere within a horizontally stratified layered earth containing an arbitrary number of resistivity layers. Model results for the normal well‐logging array indicate that large departures between true and apparent resistivity can be caused by thin beds or highly resistant layers. A true resistivity distribution from well logs can be established by modeling when the effects from borehole rugosity and fluid resistivity are negligible. The equations derived for resistivity well logs can be used to interpret hole‐to‐hole, hole‐to‐surface, and conventional surface array data. A field example demonstrates that deviations between hole‐to‐hole field data and model results, based on well logs in the receiver hole, can be accounted for by combining the resistivity logging models in the receiver holes with information from geologic logs. Differences between the field data and the layered‐model results are attributed to lateral changes between or near the source and receiver holes.

The Effect of Roughness Features on Mos Surface Electric Field and Fowler-Nordheim Tunneling Behavior

1997 ◽  
Vol 473 ◽  
Author(s):  
Heng-Chih Lin ◽  
Edwin C. Kan ◽  
Toshiaki Yamanaka ◽  
Simon J. Fang ◽  
Kwame N. Eason ◽  
...  
Keyword(s):  
Electric Field ◽  
Three Dimensional ◽  
Tunneling Current ◽  
Gate Oxide ◽  
Oxide Thickness ◽  
Interface Roughness ◽  
Normal Electric Field ◽  
Surface Electric Field ◽  
Tunneling Behavior ◽  
Nordheim Tunneling

ABSTRACTFor future CMOS GSI technology, Si/SiO2 interface micro-roughness becomes a non-negligible problem. Interface roughness causes fluctuations of the surface normal electric field, which, in turn, change the gate oxide Fowler-Nordheim tunneling behavior. In this research, we used a simple two-spheres model and a three-dimensional Laplace solver to simulate the electric field and the tunneling current in the oxide region. Our results show that both quantities are strong functions of roughness spatial wavelength, associated amplitude, and oxide thickness. We found that RMS roughness itself cannot fully characterize surface roughness and that roughness has a larger effect for thicker oxide in terms of surface electric field and tunneling behavior.

Scattering by a semi-infinite resistive strip of dominant-mode propagation in an infinite rectangular wave-guide

1956 ◽  
Vol 52 (3) ◽  
pp. 553-563 ◽  
Author(s):  
V. M. Papadopoulos
Keyword(s):  
Electric Field ◽  
Digital Computer ◽  
Transverse Electric ◽  
Dominant Mode ◽  
Surface Resistivity ◽  
Wave Guide ◽  
Mode Propagation ◽  
Rectangular Wave ◽  
Electric Mode ◽  
Transverse Electric Mode

ABSTRACTThe scattering of the dominant transverse electric mode in an infinite perfectly conducting rectangular wave-guide by a semi-infinite resistive strip, centrally placed and parallel to the electric field, is calculated by the use of Laplace transforms. Formulae are derived for the amplitude of the scattered waves, and the numerical results, obtained using a digital computer, are given for various values of the surface resistivity of the strip.

scholarly journals Quantification of solute deuterium in titanium deuteride by atom probe tomography with both laser pulsing and high-voltage pulsing: influence of the surface electric field

2019 ◽  
Vol 21 (5) ◽  
pp. 053025 ◽  
Author(s):  
Y H Chang ◽  
I Mouton ◽  
L Stephenson ◽  
M Ashton ◽  
G K Zhang ◽  
...  
Keyword(s):  
Electric Field ◽  
High Voltage ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Titanium Deuteride ◽  
Surface Electric Field

scholarly journals "A study on the direct interpretation of dipole sounding resistivity measurements over layered earth"

1973 ◽  
Vol 21 (4) ◽  
pp. 800-800
Author(s):  
U. C. Das ◽  
D. P. Ghosh
Keyword(s):  
Layered Earth ◽  
Resistivity Measurements ◽  
Direct Interpretation

Lifting of the Spin Degeneracy of Hole Subbands in a Surface Electric Field on Silicon

1984 ◽  
Vol 53 (5) ◽  
pp. 493-496 ◽  
Author(s):  
A. D. Wieck ◽  
E. Batke ◽  
D. Heitmann ◽  
J. P. Kotthaus ◽  
E. Bangert
Keyword(s):  
Electric Field ◽  
Spin Degeneracy ◽  
Surface Electric Field

Characterization of Si wafers by μ-PCD with surface electric field

2000 ◽  
Vol 73 (1-3) ◽  
pp. 230-234 ◽  
Author(s):  
M Ichimura ◽  
M Hirano ◽  
A Tada ◽  
E Arai ◽  
H Takamatsu ◽  
...  
Keyword(s):  
Electric Field ◽  
Surface Electric Field

Effects of surface electric field on SnO 2 room temperature gas sensors fabricated on nanospike substrates

2012 ◽  
Author(s):  
Haizhou Ren ◽  
Pengtao Wang ◽  
Haibin Huo ◽  
Mengyan Shen ◽  
Marina Ruths ◽  
...  
Keyword(s):  
Electric Field ◽  
Gas Sensors ◽  
Room Temperature ◽  
Surface Electric Field
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