Emission in Wide Band Gap II-VI Semiconductor Compounds with Low Dimensional Structure

2003 ◽  
pp. 211-216
Author(s):  
Y Yang ◽  
X Fan ◽  
J Zhang ◽  
Y Liu ◽  
Y Lu ◽  
...  
1998 ◽  
Vol 540 ◽  
Author(s):  
G. Teichert ◽  
L. Schleicher ◽  
Ch. Knedlik ◽  
M. Voelskov ◽  
W. Skorupa ◽  
...  

AbstractPhotothermal methods provide a valuable complement to the destructive measurement techniques for the detection of the optimal process conditions in ion beam synthesis of wide band gap semiconductor compounds. In addition to their nondestructive and non contact qualities, they are highly sensitive to changes of thermophysical properties due to structural changes. Analyses have been carried out with (SiC)l-x(AIN)x compounds, formed by ion beam synthesis.


Author(s):  
Joanna L. Batstone

Interest in II-VI semiconductors centres around optoelectronic device applications. The wide band gap II-VI semiconductors such as ZnS, ZnSe and ZnTe have been used in lasers and electroluminescent displays yielding room temperature blue luminescence. The narrow gap II-VI semiconductors such as CdTe and HgxCd1-x Te are currently used for infrared detectors, where the band gap can be varied continuously by changing the alloy composition x.Two major sources of precipitation can be identified in II-VI materials; (i) dopant introduction leading to local variations in concentration and subsequent precipitation and (ii) Te precipitation in ZnTe, CdTe and HgCdTe due to native point defects which arise from problems associated with stoichiometry control during crystal growth. Precipitation is observed in both bulk crystal growth and epitaxial growth and is frequently associated with segregation and precipitation at dislocations and grain boundaries. Precipitation has been observed using transmission electron microscopy (TEM) which is sensitive to local strain fields around inclusions.


Author(s):  
Raquel Caballero ◽  
Leonor de la Cueva ◽  
Andrea Ruiz-Perona ◽  
Yudenia Sánchez ◽  
Markus Neuschitzer ◽  
...  

2013 ◽  
Vol 28 (6) ◽  
pp. 671-676 ◽  
Author(s):  
Yu-Qing ZHANG ◽  
Li-Li ZHAO ◽  
Shi-Long XU ◽  
Chao ZHANG ◽  
Xiao-Ying CHEN ◽  
...  

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