Light scattering by low-frequency excitations in quasi-periodic n -alkane/urea adducts

1998 ◽  
Vol 43 (5) ◽  
pp. 546-551 ◽  
Author(s):  
J Ollivier ◽  
C Ecolivet ◽  
S Beaufils ◽  
F Guillaume ◽  
T Breczewski
Keyword(s):  
Light Scattering ◽  
Low Frequency ◽  
Urea Adducts

Low-frequency depolarized light scattering from fluids

Physica ◽  
1973 ◽  
Vol 64 (2) ◽  
pp. 247-259 ◽  
Author(s):  
N.D. Gershon ◽  
I. Oppenheim
Keyword(s):  
Light Scattering ◽  
Low Frequency ◽  
Depolarized Light Scattering

Low-frequency light scattering in silica xerogels: Influence of the heat treatment

1999 ◽  
Vol 79 (11-12) ◽  
pp. 2081-2089 ◽  
Author(s):  
F. Terki ◽  
J. N. Pilliez ◽  
T. Woignier ◽  
J. Pelous ◽  
A. Fontana ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Light Scattering ◽  
Low Frequency ◽  
Silica Xerogels

Light Scattering from Pulsed Laser Deposited BaBi4Ti4O15 Thin Films

2000 ◽  
Vol 623 ◽  
Author(s):  
R.K. Soni ◽  
Anju Dixit ◽  
R. S. Katiyar ◽  
A. Pignolet ◽  
K.M. Satyalakshmi ◽  
...  
Keyword(s):  
Thin Films ◽  
Light Scattering ◽  
Room Temperature ◽  
Layer Structure ◽  
Low Frequency ◽  
Pulsed Laser ◽  
Buffer Layers ◽  
Frequency Mode ◽  
High Frequency Vibrations ◽  
Low Frequency Mode

AbstractLight scattering investigations are carried out on BaBi4Ti4O15 (BBiT) which is a member of the Bi-layer structure ferroelectric oxide with n = 4. The BBiT thin films, thickness ∼ 300 nm, were grown on epitaxial conducting LaNiO3 electrodes on epitaxial buffer layers on (100) silicon by pulsed laser deposition. Micro-Raman measurements performed on these films reveal a sharp low-frequency mode at 51 cm−1 along with broad highfrequeficy modes corresponding to other lattice vibrations including TiO6 octahedra. No temperature dependence of the low frequency mode is seen while a weak dependence of the broad high frequency vibrations are observed in the mixed oriented regions. Raman polarization carried out at room temperature indicates that the prominent modes have Alg and Eg symmetries in the BaBi4Ti4O15 thin films.

Low-Frequency Inelastic Light Scattering of Glassy Ba2TiGe2O8 during Heating Process

2010 ◽  
Vol 445 ◽  
pp. 225-228
Author(s):  
Yoshihiro Takahashi ◽  
Hirokazu Masai ◽  
Takumi Fujiwara ◽  
Minoru Osada
Keyword(s):  
Glass Transition ◽  
Transition Temperature ◽  
Light Scattering ◽  
Low Frequency ◽  
Structural Heterogeneity ◽  
Heating Process ◽  
In Situ Observation ◽  
Inelastic Light Scattering ◽  
Crystallization Tendency

In-situ observation of inelastic light scattering of boson region in glassy Ba2TiGe2O8 (BTG) was performed during heating process. The in-situ boson observation revealed structural relaxation below glass-transition temperature in the as-quenched sample, suggesting the nanometric structural heterogeneity. Relation of the boson behavior to crystallization tendency is also discussed.

Low-frequency light-scattering spectroscopy of powders

1996 ◽  
Vol 13 (6) ◽  
pp. 1130 ◽  
Author(s):  
Joel Hernandez ◽  
Gen Li ◽  
Herman Z. Cummins ◽  
Robert H. Callender ◽  
Robert M. Pick
Keyword(s):  
Light Scattering ◽  
Low Frequency ◽  
Light Scattering Spectroscopy

On the Assignment and Directional Dispersion of Polar Phonon Modes in K3Cu(CN)4 and K3Ag(CN)4

1974 ◽  
Vol 29 (7) ◽  
pp. 1011-1016
Author(s):  
W. Nitsch ◽  
H. J. Falge ◽  
R. Claus
Keyword(s):  
Light Scattering ◽  
High Frequency ◽  
Low Frequency ◽  
Frequency Region ◽  
Longitudinal Vibrations ◽  
Phonon Modes ◽  
High Frequency Region ◽  
Single Crystalline ◽  
Scattering Measurements ◽  
Stretching Vibrations

Polar phonon modes in single crystalline K3Cu(CN)4 and K3Ag(CN)4 have been experimentally studied by light scattering. Measurements at 293, 82 and 6 K made possible assignments in the low frequency region from 0 to about 700 cm-1 and the high frequency region from 2030 to about 2100 cm-1 originating from the C≡N stretching vibrations. Directional dispersion due to the anisotropy of K3Cu(CN)4 has been studied and allowed the identification of the transversal and longitudinal vibrations in the high frequency region. IR-reflectivity measurements, partly on the basis of the ATR-method, have been used in order to support the assignments in this region.

Sign in / Sign up

Export Citation Format

Share Document