A Method for Performing the Analog Fourier Transform for Interference Modulation Spectroscopy

1964 ◽  
Vol 3 (3) ◽  
pp. 367 ◽  
Author(s):  
P. Vogel ◽  
L. Genzel
Keyword(s):  
Fourier Transform ◽  
Modulation Spectroscopy ◽  
Interference Modulation

Dual Source Fourier Transform Polarization Modulation Spectroscopy: An Improved Method for the Measurement of Circular and Linear Dichroism

2004 ◽  
Vol 58 (6) ◽  
pp. 647-654 ◽  
Author(s):  
Laurence A. Nafie ◽  
Henry Buijs ◽  
Allan Rilling ◽  
Xiaolin Cao ◽  
Rina K. Dukor
Keyword(s):  
Fourier Transform ◽  
Linear Dichroism ◽  
Polarization Modulation ◽  
Improved Method ◽  
Modulation Spectroscopy ◽  
Dual Source

Fourier transform echo‐modulation spectroscopy: The verdazyl biradicals

1975 ◽  
Vol 62 (3) ◽  
pp. 1190-1191 ◽  
Author(s):  
I. M. Brown ◽  
R. W. Kreilick
Keyword(s):  
Fourier Transform ◽  
Modulation Spectroscopy

scholarly journals Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer

2015 ◽  
Vol 2015 ◽  
pp. 1-4 ◽  
Author(s):  
Rilong Liu
Keyword(s):  
Fourier Transform ◽  
Modulation Depth ◽  
Michelson Interferometer ◽  
Surface Shape ◽  
Fourier Transform Spectrometer ◽  
Shape Error ◽  
Paper Briefly ◽  
Interference Modulation ◽  
Reflectance Change ◽  
The Fourier Transform

Based on the principle of the Michelson interferometer, the paper briefly describes the theoretical significance and calculates and deduces three expressions of the interference modulation depth. The influence of the surface shape error of plane mirror on modulation depth is analyzed, and the tolerance of error is also pointed out. Moreover, the dependence of modulation depth on the reflectance change of beam splitter interface is also analyzed, and the curve is given. It is concluded that this paper is of general significance for the Fourier transform spectrometer based on the principle of the Michelson two-beam interference.

scholarly journals Fourier-transform spatial modulation spectroscopy of single gold nanorods

Nanophotonics ◽  
2018 ◽  
Vol 7 (4) ◽  
pp. 715-726 ◽  
Author(s):  
Heiko Kollmann ◽  
Martin Esmann ◽  
Julia Witt ◽  
Aleksandra Markovic ◽  
Vladimir Smirnov ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Gold Nanorods ◽  
Time Resolution ◽  
Time Domain ◽  
Signal To Noise Ratio ◽  
Spatial Modulation ◽  
High Signal ◽  
Extinction Cross Section ◽  
Modulation Spectroscopy ◽  
The Time Domain

AbstractSensing the scattered fields of single metallic nanostructures is a crucial step towards the applications of isolated plasmonic antennas, such as for the sensing of single molecules or nanoparticles. In the past, both near- and far-field spectroscopy methods have been applied to monitor single plasmonic resonances. So far, however, these spectral-domain techniques do not yet provide the femtosecond time resolution that is needed to probe the dynamics of plasmonic fields in the time domain. Here, we introduce a time-domain technique that combines broadband Fourier-transform spectroscopy and spatial modulation spectroscopy (FT-SMS) to quantitatively measure the extinction spectra of the isolated gold nanorods with a nominal footprint of 41×10 nm2. Using a phase-stable pulse pair for excitation, the technique is capable of rejecting off-resonant stray fields and providing absolute measurements of the extinction cross section. Our results indicate that the method is well suited for measuring the optical response of strongly coupled hybrid systems with high signal-to-noise ratio. It may form the basis for new approaches towards time-domain spectroscopy of single nanoantennas with few-cycle time resolution.

Comparison of Calculated and Recorded Electron Energy-Loss Spectra of Aluminium and Carbon

1990 ◽  
Vol 48 (2) ◽  
pp. 64-65
Author(s):  
L. Reimer ◽  
R. Oelgeklaus
Keyword(s):  
Fourier Transform ◽  
Energy Loss ◽  
Electron Energy ◽  
Rotational Symmetry ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Two Dimensional ◽  
Image Position ◽  
Electron Energy Loss

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.

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