scholarly journals Parallel spectroscopic ellipsometry for ultra-fast thin film characterization

2020 ◽  
Vol 28 (7) ◽  
pp. 9288 ◽  
Author(s):  
Andrey Nazarov ◽  
Michael Ney ◽  
Ibrahim Abdulhalim
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Thin Film Characterization

High-temperature superconductor thin-film characterization by the modulated optical reflectance technique

1995 ◽  
Vol 8 (8) ◽  
pp. 667-672 ◽  
Author(s):  
D P Almond ◽  
A K Barker ◽  
A C Bento ◽  
S K Singh ◽  
N J Appleyard ◽  
...  
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
High Temperature Superconductor ◽  
Optical Reflectance ◽  
Thin Film Characterization

Ferroelectric thin-film characterization using a coplanar waveguide bandstop filter

2006 ◽  
Vol 203 (2) ◽  
pp. 379-385
Author(s):  
Qingduan Meng ◽  
Xueqiang Zhang ◽  
Fei Li ◽  
Jiandong Huang ◽  
Xiaohong Zhu ◽  
...  
Keyword(s):  
Thin Film ◽  
Coplanar Waveguide ◽  
Ferroelectric Thin Film ◽  
Thin Film Characterization ◽  
Bandstop Filter

scholarly journals Thin‐film hermeticity: A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry

1988 ◽  
Vol 64 (8) ◽  
pp. 4175-4180 ◽  
Author(s):  
S. Orzeszko ◽  
Bhola N. De ◽  
John A. Woollam ◽  
John J. Pouch ◽  
Samuel A. Alterovitz ◽  
...  
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Spectroscopic Ellipsometry ◽  
Variable Angle ◽  
Diamondlike Carbon ◽  
Variable Angle Spectroscopic Ellipsometry

Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

2018 ◽  
Vol 6 (39) ◽  
pp. 10450-10455 ◽  
Author(s):  
Minglin Zhao ◽  
Yujun Shi ◽  
Jun Dai ◽  
Jie Lian
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Interband Transitions ◽  
Hybrid Perovskite ◽  
Ellipsometric Study

Complex optical constants and interband transitions of a hybrid perovskite CsPbBr3 thin film measured by spectroscopic ellipsometry.

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