scholarly journals Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy

2021 ◽  
Author(s):  
Kana Sumihara ◽  
Sho Okubo ◽  
Makoto Okano ◽  
Hajime Inaba ◽  
Shinichi Watanabe
2010 ◽  
Vol 46 (4) ◽  
pp. 411-417 ◽  
Author(s):  
Yang MENG ◽  
Lin GU ◽  
Wenzheng ZHANG

1968 ◽  
Vol 12 ◽  
Author(s):  
R. Goossens

A precise method for the determination of the increment of the  basal area using the PressIer bore. Refering to  previous research showing that the basal area of the corsica pine could be  characterized by an ellips, we present in this paper a precise method for the  determination of the increment of the basal area. In this method we determine  the direction of the maximum diameter, we measure this diameter and we take a  core in one of the points of tangency of the caliper with the measured tree.  The determination of the diameter perpendicular to the maximum diameter  finishes the work wich is to be done in the forest. From the classical  measurements effectuated on the core and from the measured diameters we can  then determine the form (V) and the excentricity (e). Substituting these two  parameters in the formula 2 or 2', we can also calculate the error of a  radius measured on the core with respect to the representative radius, This  error with them allow us to correct the measured value of the minimum or the  maximum radius and we will be able to do a precise determination of the  increment.


Author(s):  
Ferrari Colin ◽  
Resongles Eléonore ◽  
Freydier Rémi ◽  
Casiot Corinne

Thiol-functionalized silica powder allowed single-step purification of antimony for exploring stable Sb isotope signatures in the environment.


Nanomaterials ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 560
Author(s):  
Alexandra Carvalho ◽  
Mariana C. F. Costa ◽  
Valeria S. Marangoni ◽  
Pei Rou Ng ◽  
Thi Le Hang Nguyen ◽  
...  

We show that the degree of oxidation of graphene oxide (GO) can be obtained by using a combination of state-of-the-art ab initio computational modeling and X-ray photoemission spectroscopy (XPS). We show that the shift of the XPS C1s peak relative to pristine graphene, ΔEC1s, can be described with high accuracy by ΔEC1s=A(cO−cl)2+E0, where c0 is the oxygen concentration, A=52.3 eV, cl=0.122, and E0=1.22 eV. Our results demonstrate a precise determination of the oxygen content of GO samples.


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