Laser-Diode Based Scanning Force Microscope and Ultrafast Sampling Probe

1995 ◽  
Author(s):  
John Nees ◽  
Douglas Craig ◽  
Soichi Hama ◽  
Shin ichi Wakana
Keyword(s):  
Laser Diode ◽  
Scanning Force Microscope ◽  
Sampling Probe ◽  
Scanning Force

Compact scanning-force microscope using a laser diode

1988 ◽  
Vol 13 (12) ◽  
pp. 1057 ◽  
Author(s):  
Dror Sarid ◽  
L. Stephen Bell ◽  
Doug Iams ◽  
Volker Weissenberger
Keyword(s):  
Laser Diode ◽  
Scanning Force Microscope ◽  
Scanning Force

Performance of a scanning force microscope using a laser diode

1990 ◽  
Vol 8 (1) ◽  
pp. 378-382 ◽  
Author(s):  
Dror Sarid ◽  
Douglas A. Iams ◽  
Jeffery T. Ingle ◽  
Volker Weissenberger ◽  
Josef Ploetz
Keyword(s):  
Laser Diode ◽  
Scanning Force Microscope ◽  
Scanning Force

Nanometer‐scale field‐induced oxidation of Si(111):H by a conducting‐probe scanning force microscope: Doping dependence and kinetics

1995 ◽  
Vol 67 (21) ◽  
pp. 3144-3146 ◽  
Author(s):  
T. Teuschler ◽  
K. Mahr ◽  
S. Miyazaki ◽  
M. Hundhausen ◽  
L. Ley
Keyword(s):  
Nanometer Scale ◽  
Scanning Force Microscope ◽  
Doping Dependence ◽  
Scale Field ◽  
Scanning Force

Fiber interferometer-based variable temperature scanning force microscope

1997 ◽  
Vol 68 (4) ◽  
pp. 1776-1778 ◽  
Author(s):  
R. Euler ◽  
U. Memmert ◽  
U. Hartmann
Keyword(s):  
Variable Temperature ◽  
Scanning Force Microscope ◽  
Scanning Force ◽  
Temperature Scanning
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