Light field 3D measurement using unfocused plenoptic cameras

2018 ◽  
Vol 43 (15) ◽  
pp. 3746 ◽  
Author(s):  
Zewei Cai ◽  
Xiaoli Liu ◽  
Qijian Tang ◽  
Xiang Peng ◽  
Bruce Zhi Gao
Keyword(s):  
Author(s):  
Yuki Shiba ◽  
Satoshi Ono ◽  
Ryo Furukawa ◽  
Shinsaku Hiura ◽  
Hiroshi Kawasaki

Author(s):  
T. Fuse ◽  
Y. Kajihara

Abstract. In recent years, the demand for inexpensive, simple, and highly accurate 3D measurement has been increasing. Representative methods, photogrammetry, and shape from focus (SfF) have limitations in terms of measurement time and labour. In order to solve them, computational photography (CP) has been proposed. A light field camera, based on CP, has also been developed. It has a feature to acquire multi-view and multi-focus images simultaneously in one shot. It is possible to perform 3D measurements with less time and labour for photographing and calculation processing using these images. In this study, we combined the photogrammetry as applied to multi-view images with the SfF as applied to multi-focus images using a light field camera. We applied the proposed method to a rigid body and verified its accuracy. We confirmed that the proposed method achieved more accurate results than the photogrammetry and the SfF method. Furthermore, we applied the proposed method to screws and cracks on walls of buildings and affirmed its applicability. Finally, we suggested future work on the developed method.


Sensors ◽  
2019 ◽  
Vol 19 (20) ◽  
pp. 4399 ◽  
Author(s):  
Haoxin Ma ◽  
Zhiwen Qian ◽  
Tingting Mu ◽  
Shengxian Shi

The precise combination of image sensor and micro-lens array enables light-field cameras to record both angular and spatial information of incoming light, therefore, one can calculate disparity and depth from one single light-field image captured by one single light-field camera. In turn, 3D models of the recorded objects can be recovered, which means a 3D measurement system can be built using a light-field camera. However, reflective and texture-less areas in light-field images have complicated conditions, making it hard to correctly calculate disparity with existing algorithms. To tackle this problem, we introduce a novel end-to-end network VommaNet to retrieve multi-scale features from reflective and texture-less regions for accurate disparity estimation. Meanwhile, our network has achieved similar or better performance in other regions for both synthetic light-field images and real-world data compared to the state-of-the-art algorithms.


2020 ◽  
pp. 108-115 ◽  
Author(s):  
Vladimir P. Budak ◽  
Anton V. Grimaylo

The article describes the role of polarisation in calculation of multiple reflections. A mathematical model of multiple reflections based on the Stokes vector for beam description and Mueller matrices for description of surface properties is presented. On the basis of this model, the global illumination equation is generalised for the polarisation case and is resolved into volume integration. This allows us to obtain an expression for the Monte Carlo method local estimates and to use them for evaluation of light distribution in the scene with consideration of polarisation. The obtained mathematical model was implemented in the software environment using the example of a scene with its surfaces having both diffuse and regular components of reflection. The results presented in the article show that the calculation difference may reach 30 % when polarisation is taken into consideration as compared to standard modelling.


2016 ◽  
Vol 136 (12) ◽  
pp. 522-531
Author(s):  
Yuta Ideguchi ◽  
Yuki Uranishi ◽  
Shunsuke Yoshimoto ◽  
Yoshihiro Kuroda ◽  
Masataka Imura ◽  
...  
Keyword(s):  

2018 ◽  
Vol 2018 (4) ◽  
pp. 142-1-142-5
Author(s):  
Hiroaki Yano ◽  
Tomohiro Yendo
Keyword(s):  

2019 ◽  
Vol 2019 (3) ◽  
pp. 636-1-636-6
Author(s):  
H. Harlyn Baker ◽  
Gregorij Kurillo ◽  
Allan Miller ◽  
Alessandro Temil ◽  
Tom Defanti ◽  
...  

Author(s):  
Katherine V. Whittington

Abstract The electronics supply chain is being increasingly infiltrated by non-authentic, counterfeit electronic parts, whose use poses a great risk to the integrity and quality of critical hardware. There is a wide range of counterfeit parts such as leads and body molds. The failure analyst has many tools that can be used to investigate counterfeit parts. The key is to follow an investigative path that makes sense for each scenario. External visual inspection is called for whenever the source of supply is questionable. Other methods include use of solvents, 3D measurement, X-ray fluorescence, C-mode scanning acoustic microscopy, thermal cycle testing, burn-in technique, and electrical testing. Awareness, vigilance, and effective investigations are the best defense against the threat of counterfeit parts.


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