scholarly journals Design and testing of a supercapacitor storage system for the flash recharge of electric buses

Author(s):  
Antonino Genovese ◽  
Fabio Cignini ◽  
Marco Pierini ◽  
Lorenzo Berzi ◽  
Riccardo Barbieri ◽  
...  
2016 ◽  
Author(s):  
Mingyu Wang ◽  
Edward Wolfe ◽  
Timothy Craig ◽  
Tim J. Laclair ◽  
Omar Abdelaziz ◽  
...  

2020 ◽  
Vol 226 ◽  
pp. 113520
Author(s):  
Baolin An ◽  
Jiaxiang Chen ◽  
Zhang Deng ◽  
Tao Zhang ◽  
Junjie Wang ◽  
...  

Author(s):  
Sean Monemi ◽  
Matt Easton ◽  
Chris Freire

In this project, we designed a small scale model of a solar updraft tower. Our design was based upon previous renderings for solar updraft towers in Spain and Arizona. The purpose of our small scale solar updraft tower was twofold: 1) to prove the theory behind the solar updraft tower is plausible and 2) to produce enough energy to charge a battery storage system. The battery storage system would be used as a backup for fault conditions in our Smart Grid system. Our main objectives were to find optimal dimensions and materials to construct our solar updraft tower, all within the constraints of a budget. Our goal was to use what we’ve learned through design and testing to expand the knowledge of solar updraft towers.


2021 ◽  
Vol 13 (1) ◽  
pp. 57
Author(s):  
Luca Pugi ◽  
Adriano Alessandrini ◽  
Riccardo Barbieri ◽  
Lorenzo Berzi ◽  
Marco Pierini ◽  
...  

Author(s):  
Y. Kokubo ◽  
W. H. Hardy ◽  
J. Dance ◽  
K. Jones

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.


2006 ◽  
Author(s):  
L. Janssen ◽  
N. Anderson ◽  
R. Weber ◽  
P. Cassidy ◽  
T. Nelson
Keyword(s):  

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