scholarly journals Approach to observe folded chains of syndiotactic polystyrene on solution-grown crystals by atomic force microscopy

e-Polymers ◽  
2003 ◽  
Vol 3 (1) ◽  
Author(s):  
Nobuyuki Suto ◽  
Atsuhiro Fujimori ◽  
Toru Masuko
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Electron Diffraction Pattern ◽  
Polymer Chains ◽  
Syndiotactic Polystyrene ◽  
Mesoscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

Abstract Folded chains of syndiotactic polystyrene located on the surface of its solution-grown crystals (SGCs) have been observed on nano scale by use of atomic force microscopy (AFM). Transmission electron micrographs of the SGCs on the mesoscopic scale exhibited truncated-lozenge platelets accompanied by a sharp electron diffraction pattern of the β”-form. AFM images of selected areas on the SGC surface indicated folded chains existing periodically on the surface with c. 1.3 to 1.4 nm spacing, suggesting that the polymer chains are aligned in parallel with the {230} growth faces of SGC.

Defect-Engineered Graded GexSi1-x Buffers on Si (001) with Extreme Low Threading Dislocation Density

1995 ◽  
Vol 378 ◽  
Author(s):  
G. Kissinger ◽  
T. Morgenstern ◽  
G. Morgenstern ◽  
H. B. Erzgräber ◽  
H. Richter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Dislocation Density ◽  
Threading Dislocation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Threading Dislocation Density

AbstractStepwise equilibrated graded GexSii-x (x≤0.2) buffers with threading dislocation densities between 102 and 103 cm−2 on the whole area of 4 inch silicon wafers were grown and studied by transmission electron microscopy, defect etching, atomic force microscopy and photoluminescence spectroscopy.

The structure of hydrous flocs prepared by batch and continuous flow water treatment systems and obtained by optical, electron and atomic force microscopy

1997 ◽  
Vol 36 (4) ◽  
pp. 41-48 ◽  
Author(s):  
A. Cornelissen ◽  
M. G. Burnett ◽  
R. D. McCall ◽  
D. T. Goddard
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Continuous Flow ◽  
Structural Information ◽  
Preparation Technique ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Optical Electron ◽  
Artefact Formation

This paper concerns the imaging of hydrous floc particles by Light Microscopy (LM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). The use of a microscope technique means that visual structural information is obtained, in contrast with other techniques measuring particle characteristics. It was found that when a preparation technique was used that involves cryogenic freezing of the sample, before observation in the SEM, larger (1-100 μm) floc particles could be imaged without the loss of structural information normally caused by drying the sample. Damage caused by drying was not apparent with the TEM technique used. It was shown that the various microscope techniques produced compatible results, together covering a wide size range (10 nm-5mm). This indicates that major artefact formation due to sample preparation is unlikely. It was furthermore shown that when a micro-scale continuous flow system was used the reproducibility of the floc structure observed increased.

Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope

1997 ◽  
Vol 3 (3) ◽  
pp. 203-213 ◽  
Author(s):  
J.A. DeRose ◽  
J.-P. Revel
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Scanning Force Microscopy ◽  
Image Deconvolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Scanning Force

Abstract: We have developed a method for the examination of atomic force microscopy (scanning force microscopy) tips using a high-resolution transmission electron microscope (TEM). The tips can be imaged in a nondestructive way, enabling one to observe the shape of an atomic force microscope probe in the vicinity of the apex with high resolution. We have obtained images of atomic force microscopy probes with a resolution on the order of 1 nm. The tips can be imaged repeatedly, so one can examine tips before and after use. We have found that the tip can become blunted with use, the rate of wear depending upon the sample and tip materials and the scanning conditions. We have also found that the tips easily accrue contamination. We have studied both commercially produced tips, as well as tips grown by electron beam deposition. Direct imaging in the TEM should prove useful for image deconvolution methods because one does not have to make any assumptions concerning the general shape of the tip profile.

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