scholarly journals Experimental demonstration of broadband negative refraction at visible frequencies by critical layer thickness analysis in a vertical hyperbolic metamaterial

Nanophotonics ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Hanlyun Cho ◽  
Younghwan Yang ◽  
Dasol Lee ◽  
Sunae So ◽  
Junsuk Rho

Abstract This work presents a vertical hyperbolic metamaterial (vHMM) consisting of a vertically stacked metal-dielectric multilayer that operates in the visible spectrum. The vHMM is designed by exploiting the relation between negative refraction and effective permittivity along the perpendicular direction of the layers (ε ⊥). When a vHMM has a high loss tangent defined by tan δ ⊥ ≡ Im(ε ⊥)/Re(ε ⊥), even a vHMM composed of relatively thick layers can generate negative refraction. A fabricable vHMM composed of gold and copolymer resist (EL8) which exhibits negative refraction at the wavelengths between 450 and 550 nm is designed using critical layer thickness analysis. The largest negative refraction is observed at the wavelength of 500 nm, where the angle of refraction reaches −1.03°. The corresponding loss tangent and equivalent refractive index are 1.08 and −0.47, respectively. However, negative refraction is not observed at the wavelengths longer than 550 nm due to low tan δ ⊥. We uncover that the tan δ ⊥ of a vHMM is the dominant condition for generating negative refraction rather than the ratio of layer thickness to wavelength.

2012 ◽  
Vol 184-185 ◽  
pp. 1080-1083
Author(s):  
Jian Ling Yue ◽  
Wei Shi ◽  
Ge Yang Li

A series of VC/TiN nano-multilayer films with various TiN layer thicknesses were synthesized by magnetron sputtering method. The relationship between the modulation structure and superhardness effect of the multilayer films were investigated. The results reveal that TiN below a critical layer thickness grows coherently with VC layers in multilayers. Correspondingly, the hardness and elastic modulus of the multilayers increase significantly. The maximum hardness and modulus achieved in these multilayers is 40.7GPa and 328GPa.With further increase in the TiN layer thickness, coherent structure of multilayers are destroyed, resulting in a remarkable decrease of hardness and modulus. The superhardness effect of multilayers is related to the three directional strains generated from the coherent structure.


2012 ◽  
Vol 101 (20) ◽  
pp. 202102 ◽  
Author(s):  
Simon Ploch ◽  
Tim Wernicke ◽  
Martin Frentrup ◽  
Markus Pristovsek ◽  
Markus Weyers ◽  
...  

2017 ◽  
Vol 26 (03) ◽  
pp. 1740020
Author(s):  
Tedi Kujofsa ◽  
John E. Ayers

The critical layer thickness (CLT) determines the criteria for dislocation formation and the onset of lattice relaxation. Although several theoretical models have been developed for the critical layer thickness, experimentally-measured CLTs in ZnSe/GaAs (001) heterostructures are often at variance with one another as well as with established theories. In a previous work [T. Kujofsa et al., J. Vac. Sci. Technol. B, 34, 051201 (2016)], we showed that the experimentally measured CLT may be much larger than the equilibrium value when using finite experimental resolution. In this work, we apply a general dislocation flow model to determine the apparent critical layer thickness as a function of the experimental resolution for ZnSe/GaAs (001) heterostructures. More importantly, we compare the results utilizing different equilibrium theories and therefore varying driving forces for the lattice relaxation in order to determine which established models are consistent with several measured values of CLT for ZnSe/GaAs (001) once kinetically-limited relaxation and finite experimental strain resolution are taken into account.


2000 ◽  
Vol 77 (25) ◽  
pp. 4121-4123 ◽  
Author(s):  
M. J. Reed ◽  
N. A. El-Masry ◽  
C. A. Parker ◽  
J. C. Roberts ◽  
S. M. Bedair

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