Structures and properties of (001)-oriented Pb(Zr,Ti)O3 films on LaNiO3/Si(001) substrates by pulsed laser deposition

In Pb(Zr0.4Ti0.6)O3 (PZT) (110-nm-thick) films grown on (001)-oriented LaNiO3 (LNO) (50-nm-thick)/Si(001) films by pulsed laser deposition, the microstructures and various structural properties of the PZT and the underlying LNO films were comparatively studied mainly using synchrotron x-ray scattering experiments. Basically, the PZT films resembled the LNO films in microstructure, crystal orientation, and mosaic distribution. The PZT films, however, showed an isotropic structural order (in- and out-of-plane coherence lengths: 18 and 14 nm) in contrast to the anisotropic order of the LNO films (in- and out-of-plane coherence lengths: 5 and 30 nm). The PZT/LNO/Si systems displayed a good hysteresis characteristic (remanent polarization, 11.8 μC/cm2; coercive field, 36.1 kV/cm). We confirmed that oriented PZT films with reasonable ferroelectric properties can be successfully prepared on properly textured LNO films at a relatively low processing temperature.

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Effects of processing temperature on the structure and ferroelectric properties of Ba2−xSrxNaNb5O15 thin films by pulsed laser deposition

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2006.02.090 ◽

2008 ◽

Vol 449 (1-2) ◽

pp. 40-43 ◽

Cited By ~ 1

Author(s):

T. Yamasaki ◽

T. Higuchi ◽

T. Hattori ◽

T. Tsukamoto

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Ferroelectric Properties ◽

Pulsed Laser ◽

Laser Deposition ◽

Processing Temperature

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Structures and Properties of BiFeO3 Thin Films on Pt(111)/Ti/SiO2/Si Substrates Prepared by Pulsed-Laser Deposition under Various Oxygen Partial Pressures

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.760-762.714 ◽

2013 ◽

Vol 760-762 ◽

pp. 714-718 ◽

Cited By ~ 2

Author(s):

Mei Lin Yi ◽

Chuan Bin Wang ◽

Qiang Shen ◽

Lian Meng Zhang

Keyword(s):

Thin Films ◽

Surface Morphology ◽

Pulsed Laser Deposition ◽

Ferroelectric Properties ◽

Pulsed Laser ◽

Laser Deposition ◽

Si Substrates ◽

Partial Pressures ◽

Structures And Properties ◽

High Degree

Ferroelectric BiFeO3(BFO) thin films were prepared on Pt (111)/Ti/SiO2/Si substrates by pulsed-laser deposition under various oxygen partial pressures (PO2). The effects ofPO2on the phase, orientation, surface morphology, and ferroelectric properties of the films were investigated, particularly in regard to relationships between structure and properties. It was found that the crystallographic orientation and surface morphology of the BFO thin films strongly depended onPO2. Films prepared atPO2=10 Pa had a high degree of (111) orientation and densely packed grains. A maximum of twice the remanent polarization for the BFO thin film was 68 μC/cm2.

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Microstructure of Compositionally Graded PZT films Grown by Pulsed Laser Deposition

Microscopy and Microanalysis ◽

10.1017/s143192760808937x ◽

2008 ◽

Vol 14 (S3) ◽

pp. 53-56

Author(s):

S.A.S. Rodrigues ◽

A. Khodorov ◽

M. Pereira ◽

M.J.M. Gomes

Keyword(s):

Pulsed Laser Deposition ◽

Lead Zirconate Titanate ◽

Film Growth ◽

Pulsed Laser ◽

Hysteresis Loops ◽

Lead Zirconate ◽

Laser Deposition ◽

Composition Gradient ◽

Complex Structures ◽

Pzt Films

Ferroelectric films with a composition gradient have attracted much attention because of their large polarization offset present in the hysteresis loops. Lead Zirconate Titanate (PZT) films were deposited on Pt/TiO2/SiO2/Si substrates by Pulsed Laser Deposition (PLD) technique, using a Nd:YAG laser (Surelite) with a source pulse wavelength of 1064 nm and duration of 5-7 ns delivering an energy of 320 mJ per pulse and a laser fluence energy about 20 J/cm2. The film growth is performed in O2 atmosphere (0,40 mbar) while the substrate is heated at 600°C by a quartz lamp. Starting from ceramic targets based on PZT compositions and containing 5% mol. of excess of PbO to compensate the lead evaporation during heat treatment, three films with different compositions Zr/Ti 55/45, 65/35 and 92/8, and two types of complex structures were produced. These complex structures are in the case of the up-graded structure (UpG), with PZT (92/8) at the bottom, PZT (65/35) on middle and PZT (55/45) on the top, and for down-graded (DoG) one, that order is reversed.

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