Annealing-induced lattice recovery in room-temperature xenon irradiated CeO2: X-ray diffraction and electron energy loss spectroscopy experiments

2015 ◽  
Vol 30 (9) ◽  
pp. 1555-1562 ◽  
Author(s):  
Janne Pakarinen ◽  
Lingfeng He ◽  
Abdel-Rahman Hassan ◽  
Yongqiang Wang ◽  
Mahima Gupta ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Image Position ◽  
Electron Energy Loss

Abstract

scholarly journals Hexagonal barium titanate stabilized as ultra-thin film on Pt(111): an X-ray diffraction and electron energy-loss spectroscopy study

2019 ◽  
Vol 75 (a2) ◽  
pp. e241-e241
Author(s):  
Holger Meyerheim ◽  
Katayoon Mohseni ◽  
Stefan Förster ◽  
Eva Maria Zollner ◽  
Florian Schumann ◽  
...  
Keyword(s):  
Thin Film ◽  
Barium Titanate ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Energy Loss ◽  
Ultra Thin Film

Electron Microscopy and Electron Energy-Loss Spectroscopy Study of Nd1−xSrxCoO3−δ (0≤x≤1) System

2014 ◽  
Vol 20 (3) ◽  
pp. 687-691 ◽  
Author(s):  
Khalid Boulahya ◽  
Manar Hassan ◽  
Jesús C.G. Minguez ◽  
Stavros Nicolopoulos
Keyword(s):  
Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Lattice Parameter ◽  
Orthorhombic Symmetry ◽  
X Ray Diffraction ◽  
X Ray ◽  
Simple Cubic ◽  
Electron Energy Loss

AbstractA solid solution of Nd1−xSrxCoO3−δ (with x=0, 1/3, 2/3, and 1) has been prepared and characterized by a combination of X-ray diffraction, electron microscopy, and electron energy-loss spectroscopy (EELS). The structural characterization indicates that Nd-doped materials present an orthorhombic symmetry with a=√2xap, b=√2xap, and c=2xap (ap refers to lattice parameter of simple cubic perovskite), while SrCoO2.5 has an orthorhombic symmetry with a=√2xap, b=4xap, and c=√2xap. EELS analysis revealed that Co are in 3+ oxidation states but in different spin configurations.

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

A Poor Man’s Approach to Semi-Quantitative Analysis with Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 110-111
Author(s):  
M. Isaacson
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Excitation Cross Section ◽  
Incident Electron ◽  
Integral Cross Section ◽  
Image Position ◽  
Electron Energy Loss

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.

scholarly journals Using in situ electron energy-loss spectroscopy (EELS) and X-ray fluorescence microscopy (XFM) to characterize Co-Pt nanoparticles

2021 ◽  
Vol 27 (S1) ◽  
pp. 2108-2109
Author(s):  
Alexandre Foucher ◽  
Nicholas Marcella ◽  
Anna Plonka ◽  
Anatoly Frenkel ◽  
Eric Stach
Keyword(s):  
Fluorescence Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Pt Nanoparticles ◽  
X Ray ◽  
Electron Energy Loss
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