scholarly journals Phase evolution of radio frequency magnetron sputtered Cr-rich (Cr,Zr)2O3 coatings studied by in situ synchrotron X-ray diffraction during annealing in air or vacuum

2019 ◽  
Vol 34 (22) ◽  
pp. 3735-3746 ◽  
Author(s):  
Ludvig Landälv ◽  
Lina Rogström ◽  
Jun Lu ◽  
Daniel Ostach ◽  
Fredrik Eriksson ◽  
...  

Abstract

Membranes ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 373
Author(s):  
Wen-Yen Lin ◽  
Feng-Tsun Chien ◽  
Hsien-Chin Chiu ◽  
Jinn-Kong Sheu ◽  
Kuang-Po Hsueh

Zirconium-doped MgxZn1−xO (Zr-doped MZO) mixed-oxide films were investigated, and the temperature sensitivity of their electric and optical properties was characterized. Zr-doped MZO films were deposited through radio-frequency magnetron sputtering using a 4-inch ZnO/MgO/ZrO2 (75/20/5 wt%) target. Hall measurement, X-ray diffraction (XRD), transmittance, and X-ray photoelectron spectroscopy (XPS) data were obtained. The lowest sheet resistance, highest mobility, and highest concentration were 1.30 × 103 Ω/sq, 4.46 cm2/Vs, and 7.28 × 1019 cm−3, respectively. The XRD spectra of the as-grown and annealed Zr-doped MZO films contained MgxZn1−xO(002) and ZrO2(200) coupled with Mg(OH)2(101) at 34.49°, 34.88°, and 38.017°, respectively. The intensity of the XRD peak near 34.88° decreased with temperature because the films that segregated Zr4+ from ZrO2(200) increased. The absorption edges of the films were at approximately 348 nm under 80% transmittance because of the Mg content. XPS revealed that the amount of Zr4+ increased with the annealing temperature. Zr is a potentially promising double donor, providing up to two extra free electrons per ion when used in place of Zn2+.


2015 ◽  
Vol 107 (8) ◽  
pp. 081606 ◽  
Author(s):  
Matthew J. Highland ◽  
Dillon D. Fong ◽  
Guangxu Ju ◽  
Carol Thompson ◽  
Peter M. Baldo ◽  
...  

2018 ◽  
Vol 6 (24) ◽  
pp. 11496-11506 ◽  
Author(s):  
Paul Pistor ◽  
Thomas Burwig ◽  
Carlo Brzuska ◽  
Björn Weber ◽  
Wolfgang Fränzel

We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films.


2021 ◽  
Author(s):  
Rebecca McClain ◽  
Christos D. Malliakas ◽  
Jiahong Shen ◽  
Jiangang He ◽  
Chris Wolverton ◽  
...  

This work uses in situ powder X-ray diffraction studies to observe crystalline phase evolution over the course of multiple K-Bi-Q (Q = S, Se) reactions, thereby constructing a “panoramic” view of each reaction from beginning to end.


2001 ◽  
Vol 7 (S2) ◽  
pp. 1234-1235
Author(s):  
K.K. Fung ◽  
X.X. Zhang ◽  
Y.S. Kwok ◽  
Boxiong Qin

Over the years, the study of the oxidation of nanoparticles of iron by transmission electron microscopy (TEM), Mossbauer spectroscopy and X-ray diffraction has established that nanoparticles of iron have a core-shell morphology in which the iron core is enclosed by shell of polycrystalline shell of ultrasmall γ-Fe2O3 and Fe3O4 crystallites. Recently, passivated nanoparticles of iron prepared by gas condensation of plasma evaporated vapor in Tianjin University exhibit remarkable resistance to further oxidation and corrosion in air and water. We have showed by TEM that these nanoparticles of iron are protected by a 4 nm epitaxial shell of γ-Fe2O3. The epitaxial orientation relationship, established by convergent beam electron diffraction from a nanoparticle, is as follows:The [001] diffraction pattern of the oxide is rotated by 45° about a cubic axis relative to that of iron.


2016 ◽  
Vol 42 (4) ◽  
pp. 5412-5417 ◽  
Author(s):  
Sungwook Mhin ◽  
HyukSu Han ◽  
Donghyun Kim ◽  
Sunghwan Yeo ◽  
Jung-Il Lee ◽  
...  

2014 ◽  
Vol 264 ◽  
pp. 290-298 ◽  
Author(s):  
W. Zhu ◽  
D. Liu ◽  
J. Trottier ◽  
C. Gagnon ◽  
A. Guerfi ◽  
...  

2014 ◽  
Vol 941-944 ◽  
pp. 1306-1310
Author(s):  
Sheng Chien Su ◽  
Wen Chung Chang ◽  
Chia Ching Wu

Ferroelectric SrxBa1−xNb2O6 (SBN) thin films are deposited on Al/Si (100) substrates by radio frequency magnetron sputtering at room temperature. The nanograin sizes of the SBN thin films were analized by scanning electron microscopy (SEM). X-ray diffraction reveals that all the SBN thin films show an amorphous structure because they were deposited at room temperature.The capacitive properties of the SBN thin films were measured using metal ferroelectric insulation semiconductor (MFIS) structures. The memory window of the MFIS structure was characterized with a capacitance-voltage (C-V) method.


MRS Advances ◽  
2018 ◽  
Vol 3 (22) ◽  
pp. 1255-1260 ◽  
Author(s):  
Jiefu Yin ◽  
Wenzao Li ◽  
Mikaela Dunkin ◽  
Esther S. Takeuchi ◽  
Kenneth J. Takeuchi ◽  
...  

ABSTRACTUnderstanding the structural evolution of electrode material during electrochemical activity is important to elucidate the mechanism of (de)lithiation, and improve the electrochemical function based on the material properties. In this study, lithium vanadium oxide (LVO, LiV3O8) was investigated using ex-situ, in-situ, and operando experiments. Via a combination of in-situ X-ray diffraction (XRD) and density functional theory results, a reversible structural evolution during lithiation was revealed: from Li poor α phase (LiV3O8) to Li rich α phase (Li2.5V3O8) and finally β phase (Li4V3O8). In-situ and operando energy dispersive X-ray diffraction (EDXRD) provided tomographic information to visualize the spatial location of the phase evolution within the LVO electrode while inside a sealed lithium ion battery.


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