CVD Diamond Dislocations Observed by X-ray Topography, Birefrengence Image and Cathodoluminesence mapping

2011 ◽  
Vol 1282 ◽  
Author(s):  
Yukako Kato ◽  
Hitoshi Umezawa ◽  
Hirotaka Yamaguchi ◽  
Tokuyuki Teraji ◽  
Shin-ichi Shikata

ABSTRACTSemiconductor epitaxial CVD single crystal diamond is considered a potential material for power devices because of its unique characteristics. In the discussion on the relationship between crystal quality and device performance, the atomic purity and defect concentration have been considered; however, the information on the local stress-strain distribution in a single crystal is not sufficient. In this paper, the dislocation analysis is shown for the suggestion of the established standard dislocation analysis method. The aggregation of mixed dislocations is observed by the analysis by using the birefringence image, cathodoluminescence image and x-ray topography.

2011 ◽  
Vol 1282 ◽  
Author(s):  
Yukako Kato ◽  
Hitoshi Umezawa ◽  
Tokuyuki Teraji ◽  
Shin-ichi Shikata

ABSTRACTSemiconductor epitaxial CVD single crystal diamond is considered a potential material for power devices because of its unique characteristics. In the discussion on the relationship between crystal quality and device performance, the atomic purity and defect concentration have been considered; however, the information on the local stress-strain distribution in a single crystal is not sufficient. In this paper, the local stress-strain distribution of the epitaxial CVD single crystal diamond is quantitatively examined using the birefringence and cathodoluminescence images and the Raman peak-shift map. From the Raman peak-shift map, the local stress-strain is estimated and the stress is found to range from -67 MPa to +160 MPa in the observed area.


2009 ◽  
Vol 1203 ◽  
Author(s):  
Jen Bohon ◽  
John Smedley ◽  
Erik M. Muller ◽  
Jeffrey W. Keister

AbstractHigh quality single crystal and polycrystalline CVD diamond detectors with platinum contacts have been tested at the white beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response has been achieved over eleven orders of magnitude when combined with previous low flux studies. Temporal measurements with single crystal diamond detectors have resolved the ns scale pulse structure of the NSLS.


2010 ◽  
Vol 74 (6) ◽  
pp. 943-950 ◽  
Author(s):  
L. M. Sochalski-Kolbus ◽  
R. J. Angel ◽  
F. Nestola

AbstractThe volumes of a disordered An20 (Qod = 0.15), a disordered An78 (Qod = 0.55) and an ordered An78 (Qod = 0.81) were determined up to 9.569(10) GPa, 8.693(5) GPa and 9.765(10) GPa, respectively, using single-crystal X-ray diffraction. The volume variations with pressure for these samples are described with 4th-order Birch Murnaghan equations of state with V0 = 669.88(7) Å3, K0 = 59.7(7) GPa. K′ = 5.7(5), K″ = −0.8(2) GPa−1 for disordered An20, V0 = 1340.48(10) Å3, K0 = 77.6(5) GPa, K0′ = 4.0(3), K″ = -0.59(9) GPa−1 for disordered An78 and V0 = 1339.62(6) A3, K0 = 77.4(6) GPa, K′ = 4.2(4), and K″ = −0.7(1) GPa−1 for ordered An78. Along with data from previous studies (An0 ordered, An0 disordered and An2o ordered), the volumes for the disordered samples were found to be up to ∼0.3% larger than the ordered samples of the same composition. The disordered samples are softer than the ordered samples of the same composition by 4(1)% for An0, 2.5(9)% for An20 and essentially zero for An78. The relationship between volume increase, density decrease, and decreasing bulk modulus with increasing disorder is in accordance with Birch's Law.


2013 ◽  
Vol 425 (21) ◽  
pp. 212001 ◽  
Author(s):  
M Di Fraia ◽  
M Antonelli ◽  
A Tallaire ◽  
J Achard ◽  
S Carrato ◽  
...  

2017 ◽  
Vol 24 (1) ◽  
pp. 103-109 ◽  
Author(s):  
Sergey Terentyev ◽  
Maxim Polikarpov ◽  
Irina Snigireva ◽  
Marco Di Michiel ◽  
Sergey Zholudev ◽  
...  

Linear parabolic diamond refractive lenses are presented, designed to withstand high thermal and radiation loads coming from upgraded accelerator X-ray sources. Lenses were manufactured by picosecond laser treatment of a high-quality single-crystal synthetic diamond. Twelve lenses with radius of curvature at parabola apex R = 200 µm, geometrical aperture A = 900 µm and length L = 1.5 mm were stacked as a compound refractive lens and tested at the ESRF ID06 beamline. A focal spot of size 2.2 µm and a gain of 20 were measured at 8 keV. The lens profile and surface quality were estimated by grating interferometry and X-ray radiography. In addition, the influence of X-ray glitches on the focusing properties of the compound refractive lens were studied.


2008 ◽  
Vol 602 (6) ◽  
pp. 1135-1140 ◽  
Author(s):  
D. Doneddu ◽  
O.J. Guy ◽  
P.R. Dunstan ◽  
T.G.G. Maffeis ◽  
K.S. Teng ◽  
...  

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
A. Descamps ◽  
B. K. Ofori-Okai ◽  
K. Appel ◽  
V. Cerantola ◽  
A. Comley ◽  
...  

Crystals ◽  
2019 ◽  
Vol 9 (11) ◽  
pp. 561 ◽  
Author(s):  
Tatsuya Tanaka ◽  
Chiaki Tsuboi ◽  
Kazuaki Aburaya ◽  
Fumiko Kimura ◽  
Masataka Maeyama ◽  
...  

We previously reported on a method for X-ray single-crystal structure determination from a powder sample via a magnetically oriented microcrystal suspension (MOMS). The method was successfully applied to orthorhombic microcrystals (L-alanine, P212121). In this study, we apply this method to monoclinic microcrystals. Unlike most of the orthorhombic MOMSs, monoclinic MOMSs exhibit two or four orientations with the same magnetic energy (we refer to this as twin orientations), making data processing difficult. In this paper, we perform a MOMS experiment for a powder sample of monoclinic microcrystal (α-glycine, P21/n) to show that our method can also be applied to monoclinic crystals. The single-crystal structure determined in this work is in good agreement with the reported one performed on a real single crystal. Furthermore, the relationship between the crystallographic and magnetic susceptibility axes is determined.


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