Fabrication of Poly-silicon Thin Films on Glass and Flexible Substrates using Laser Initiated Metal Induced Crystallization of Amorphous Silicon

Poly-silicon thin films on glass and Kapton® substrates are fabricated using laser initiated metal induced crystallization method. Amorphous silicon films of 200 nm thickness were deposited on the two substrates. The films were capped with 200 nm aluminum films. The annealing laser was a cw Argon-ion laser system. Laser power densities ranging from 4 to 9 W/cm2 were used in the annealing process. The samples were irradiated for various periods of time. X-ray diffraction patterns from the initial results indicated the crystallization of the films. Scanning electron microscopy showed dendritic growth in the annealed samples. The composition analysis of the samples indicated aluminum-silicon alloy regions in the films.