The Grolier Codex: A Non Destructive Study of a Possible Maya Document using Imaging and Ion Beam Techniques

2007 ◽  
Vol 1047 ◽  
Author(s):  
Jose Luis Ruvalcaba ◽  
Sandra Zetina ◽  
Helena Calvo del Castillo ◽  
Elsa Arroyo ◽  
Eumelia Hernández ◽  
...  
Keyword(s):  
New York ◽  
Elemental Analysis ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Unknown Origin ◽  
Blue Pigment ◽  
Early Colonial ◽  
Paper Fibers ◽  
Non Destructive ◽  
Preparation Layer

AbstractThe Grolier Codex has been a controversial document ever since its late discovery in 1965. Because of its rare iconographical content and its unknown origin, specialists are not keen to assure its authenticity that would set it amongst the other tree known Maya codes in the world (Dresden, Paris Codex and Madrid Codex).The document that has been kept in the Museo Nacional de Antropología in Mexico City, after its exposure in 1971 at the Grolier Club of New York, has been analyzed by a set of non-destructive techniques in order to characterize its materials including paper fibers, preparation layer and colors composition. The methodology included UV imaging, IR reflectography and optic microscopy examinations as well as Particle Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) using an external beam setup for elemental analysis. All the measurements were carried out at 3MV Pelletron Accelerator of the Instituto de Física, UNAM. The aim of this work is to verify if the materials in the Grolier Codex match those found for other pre-Hispanic documents.From the elemental composition we concluded that the preparation layer shows the presence of gypsum (CaSO4), color red is due to red hematite (Fe2O3) and black is a carbon-based ink. These results agree with previous analyses carried out by Scanning Electron Microscopy (SEM-EDX) on few samples. However, the presence of Maya Blue in the blue pigment cannot be assured. The examination using UV and IR lights shows homogeneity in the inks and red color but dark areas that contain higher amounts of K in the preparation layer. This paper discusses the results obtained for the UV-IR examinations and the elemental analysis. A comparison with other studies on pre-Hispanic and early colonial codex is presented.

scholarly journals RBS, PIXE, Ion-Microbeam and SR-FTIR Analyses of Pottery Fragments from Azerbaijan

Heritage ◽  
2019 ◽  
Vol 2 (3) ◽  
pp. 1852-1873 ◽  
Author(s):  
Lorenzo Torrisi ◽  
Valentina Venuti ◽  
Vincenza Crupi ◽  
Letteria Silipigni ◽  
Mariapompea Cutroneo ◽  
...  
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Chemical Characterization ◽  
Geographic Area ◽  
X Ray ◽  
Ftir Microspectroscopy ◽  
Beam Analysis ◽  
Xix Century ◽  
Non Destructive ◽  
Archeological Site

The present work is aimed at the investigation of the ceramic bulk and pigmented glazed surfaces of ancient potteries dating back to XIX century A.D. and coming from the charming archeological site located in the Medieval Agsu town (Azerbaijan), a geographic area of special interest due to the ancient commercial routes between China, Asia Minor, and Europe. For the purpose of the study, complementary investigation tools have been exploited: non-destructive or micro-destructive investigation at elemental level by ion beam analysis (IBA) techniques, by using Rutherford Backscattering Spectrometry (RBS), Proton-Induced X-ray Emission (PIXE) spectroscopy and ion-microbeam analysis, and chemical characterization at microscopic level, by means of synchrotron radiation (SR) Fourier transform infrared (FTIR) microspectroscopy. The acquired information reveals useful for the identification of the provenance, the reconstruction of the firing technology, and finally, the identification of the pigment was used as a colorant of the glaze.

An Elemental Analysis of Different CD-R discs

2014 ◽  
Vol 5 (1) ◽  
pp. 752-756
Author(s):  
Amir Pishkoo
Keyword(s):  
Trace Elements ◽  
Elemental Analysis ◽  
Rutherford Backscattering Spectrometry ◽  
Major And Trace Elements ◽  
Major Elements ◽  
Rutherford Backscattering ◽  
X Ray ◽  
Non Destructive ◽  
Non Destructive Techniques

In this study Proton Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) as reliable and non-destructive techniques has been applied to compare thickness, major and trace elements of different brands of CD-R discs. Three elements, namely Ag, Ba, and Ti were found to be the major elements.

Ion Beam Analysis of Pigments

1990 ◽  
Vol 185 ◽  
Author(s):  
Barbara Cho ◽  
Joanna Baum ◽  
P. Revesz ◽  
W.S. Taft ◽  
D. Mayer ◽  
...  
Keyword(s):  
Elemental Analysis ◽  
Electron Microprobe ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Analytical Techniques ◽  
Nondestructive Method ◽  
Alpha Particles ◽  
Vacuum System ◽  
Thin Polymer Film ◽  
Pixe Analysis

AbstractWe have analyzed single and multiple layer paint samples to evaluate 3 MeV external beam proton induced X-ray emission (PIXE) for elemental analysis of inorganic pigments. The results are compared to those from energy dispersive electron microprobe analysis and Rutherford Backscattering Spectrometry (RBS). The advantage of PIXE is that the protons' penetration depth of 100 microns is more than 25 times greater than that of 20 keV electrons and 10 times greater than 3 MeV alpha particles, thus allowing analysis of relatively thick samples of up to 100 microns. The proton beam is passed into the atmosphere (external to the vacuum system) through a thin polymer film, and the beam area on target is 1 mmz. Electron microprobe and RBS require vacuum compatible samples; therefore, the pigments were painted on silicon wafers. Calibration was obtained from metallic thin-film samples of known thickness. The cross calibration of the three analytical techniques allowed evaluation of external PIXE analysis of paint films. We suggest that this nondestructive method is suitable for elemental analysis of drawings and paintings provided that further studies indicate no long term damage is caused.

Stoichiometric Determination of Graphite Intercalation Compounds Using Rutherford Backscatiering Spectrometry

1983 ◽  
Vol 27 ◽  
Author(s):  
L. Salamanca-Riba ◽  
B.S. Elman ◽  
M.S. Dresselhaus ◽  
T. Venkatesan
Keyword(s):  
Experimental Error ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Intercalation Compounds ◽  
Graphite Intercalation Compounds ◽  
X Ray ◽  
Donor And Acceptor ◽  
Graphite Intercalation ◽  
Non Destructive

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

Failure Analysis Strategies for Multistacked Memory Devices with TSV Interconnects

2015 ◽  
Author(s):  
Frank Altmann ◽  
Christian Grosse ◽  
Falk Naumann ◽  
Jens Beyersdorfer ◽  
Tony Veches
Keyword(s):  
Failure Analysis ◽  
Focused Ion Beam ◽  
Failure Modes ◽  
Ion Beam ◽  
Memory Devices ◽  
Metallographic Cross Section ◽  
Electron Beam Induced Current ◽  
Thermal Simulations ◽  
Lock In ◽  
Non Destructive

Abstract In this paper we will demonstrate new approaches for failure analysis of memory devices with multiple stacked dies and TSV interconnects. Therefore, TSV specific failure modes are studied on daisy chain test samples. Two analysis flows for defect localization implementing Electron Beam Induced Current (EBAC) imaging and Lock-in-Thermography (LIT) as well as adapted Focused Ion Beam (FIB) preparation and defect characterization by electron microscopy will be discussed. The most challenging failure mode is an electrical short at the TSV sidewall isolation with sub-micrometer dimensions. It is shown that the leakage path to a certain TSV within the stack can firstly be located by applying LIT to a metallographic cross section and secondly pinpointing by FIB/SEM cross-sectioning. In order to evaluate the potential of non-destructive determination of the lateral defect position, as well as the defect depth from only one LIT measurement, 2D thermal simulations of TSV stacks with artificial leakages are performed calculating the phase shift values per die level.

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

Forensic analysis of hand-written documents using laser-induced breakdown spectroscopy (LIBS) and chemometrics

2021 ◽  
Author(s):  
Felipe Ferri Hilario ◽  
Matheus Lima de Mello ◽  
Edenir Rodrigues Pereira-Filho
Keyword(s):  
Elemental Analysis ◽  
Forensic Analysis ◽  
Laser Induced Breakdown Spectroscopy ◽  
Breakdown Spectroscopy ◽  
Laser Induced Breakdown ◽  
Minimum Number ◽  
Non Destructive ◽  
Ball Point ◽  
Maximum Differentiation

With the use of Laser Induced Breakdown Spectroscopy (LIBS), fast and semi non-destructive elemental analysis of ball-point pen writings has been performed directly from paper surfaces, aiming to obtain maximum differentiation between pens with a minimum number of pulses.

Carbon Nitride Film Formation by Low Energy Positive and Negative Ion Beam Deposition

1996 ◽  
Vol 438 ◽  
Author(s):  
N. Tsubouchi ◽  
Y. Horino ◽  
B. Enders ◽  
A. Chayahara ◽  
A. Kinomura ◽  
...  
Keyword(s):  
Carbon Nitride ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
High Vacuum ◽  
Negative Ions ◽  
Low Energy ◽  
Ultra High Vacuum ◽  
Negative Ion ◽  
Nitride Film ◽  
Ion Energy

AbstractUsing a newly developed ion beam apparatus, PANDA (Positive And Negative ions Deposition Apparatus), carbon nitride films were prepared by simultaneous deposition of mass-analyzed low energy positive and negative ions such as C2-, N+, under ultra high vacuum conditions, in the order of 10−6 Pa on silicon wafer. The ion energy was varied from 50 to 400 eV. The film properties as a function of their beam energy were evaluated by Rutherford Backscattering Spectrometry (RBS), Fourier Transform Infrared spectroscopy (FTIR) and Raman scattering. From the results, it is suggested that the C-N triple bond contents in films depends on nitrogen ion energy.

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