Ion Beam Analysis of Pigments

1990 ◽  
Vol 185 ◽  
Author(s):  
Barbara Cho ◽  
Joanna Baum ◽  
P. Revesz ◽  
W.S. Taft ◽  
D. Mayer ◽  
...  
Keyword(s):  
Elemental Analysis ◽  
Electron Microprobe ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Analytical Techniques ◽  
Nondestructive Method ◽  
Alpha Particles ◽  
Vacuum System ◽  
Thin Polymer Film ◽  
Pixe Analysis

AbstractWe have analyzed single and multiple layer paint samples to evaluate 3 MeV external beam proton induced X-ray emission (PIXE) for elemental analysis of inorganic pigments. The results are compared to those from energy dispersive electron microprobe analysis and Rutherford Backscattering Spectrometry (RBS). The advantage of PIXE is that the protons' penetration depth of 100 microns is more than 25 times greater than that of 20 keV electrons and 10 times greater than 3 MeV alpha particles, thus allowing analysis of relatively thick samples of up to 100 microns. The proton beam is passed into the atmosphere (external to the vacuum system) through a thin polymer film, and the beam area on target is 1 mmz. Electron microprobe and RBS require vacuum compatible samples; therefore, the pigments were painted on silicon wafers. Calibration was obtained from metallic thin-film samples of known thickness. The cross calibration of the three analytical techniques allowed evaluation of external PIXE analysis of paint films. We suggest that this nondestructive method is suitable for elemental analysis of drawings and paintings provided that further studies indicate no long term damage is caused.

Nuclear Microprobe and Micro-PIXE Analysis of Thick Target: Program and Its Applications

1998 ◽  
Vol 08 (01) ◽  
pp. 33-45
Author(s):  
Zhongning DAI ◽  
Chaigang Ren ◽  
Fujia Yang
Keyword(s):  
Quantitative Analysis ◽  
Elemental Analysis ◽  
Rutherford Backscattering Spectrometry ◽  
Analytical Techniques ◽  
Thick Target ◽  
Nuclear Microprobe ◽  
Element Analysis ◽  
Thick Sample ◽  
Pixe Analysis ◽  
X Ray

PIXE (Particle Induced X-ray Emission), mainly Proton Induced X-ray Emission, has been developed into a well established technique for elemental analysis, especially for trace elemental analysis down to ppm or even ppb level. Nuclear Microprobe is a quickly developing technique around the world for 2 dimensional or even 3 dimensional element analysis if several nuclear analytical techniques, such as Rutherford backscattering spectrometry (RBS) can be available at the same time. The present resolution of NMP can be down to less than 1μm. To thick target analysis, i.e., the energy loss effect and the consequent X-ray cross section Change with the depth can not be neglected, therefore we have to consider the process of particle interactions with atoms in detail. In this article, NMP (Nuclear Micro-Probe) and micro-PIXE analysis of thick target, which are mainly involved into the process of ions interaction with atoms, are reviewed on the basis of work what we have done at Fudan University. The software package TSPIXE (PIXE analysis of Thick Sample), which includes different versions for different applications, developed at Fudan University for quantitative analysis of thick target and simulation of PIXE and micro-PIXE spectra are described and its performance is demonstrated too. The TSPIXE package, which includes TSPIXE version I, version II, version III and TSμPIXE, was written in FORTRAN and C computer language and can be run at PC computer under MSDOS or WINDOWS environment. From the different demonstrations and applications we can see the package is very useful to quantitative analysis of thick samples and to understand the relationships between elemental X-ray intensity distributions and concentration distributions, sample structure, beam size and etc.

The Grolier Codex: A Non Destructive Study of a Possible Maya Document using Imaging and Ion Beam Techniques

2007 ◽  
Vol 1047 ◽  
Author(s):  
Jose Luis Ruvalcaba ◽  
Sandra Zetina ◽  
Helena Calvo del Castillo ◽  
Elsa Arroyo ◽  
Eumelia Hernández ◽  
...  
Keyword(s):  
New York ◽  
Elemental Analysis ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Unknown Origin ◽  
Blue Pigment ◽  
Early Colonial ◽  
Paper Fibers ◽  
Non Destructive ◽  
Preparation Layer

AbstractThe Grolier Codex has been a controversial document ever since its late discovery in 1965. Because of its rare iconographical content and its unknown origin, specialists are not keen to assure its authenticity that would set it amongst the other tree known Maya codes in the world (Dresden, Paris Codex and Madrid Codex).The document that has been kept in the Museo Nacional de Antropología in Mexico City, after its exposure in 1971 at the Grolier Club of New York, has been analyzed by a set of non-destructive techniques in order to characterize its materials including paper fibers, preparation layer and colors composition. The methodology included UV imaging, IR reflectography and optic microscopy examinations as well as Particle Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) using an external beam setup for elemental analysis. All the measurements were carried out at 3MV Pelletron Accelerator of the Instituto de Física, UNAM. The aim of this work is to verify if the materials in the Grolier Codex match those found for other pre-Hispanic documents.From the elemental composition we concluded that the preparation layer shows the presence of gypsum (CaSO4), color red is due to red hematite (Fe2O3) and black is a carbon-based ink. These results agree with previous analyses carried out by Scanning Electron Microscopy (SEM-EDX) on few samples. However, the presence of Maya Blue in the blue pigment cannot be assured. The examination using UV and IR lights shows homogeneity in the inks and red color but dark areas that contain higher amounts of K in the preparation layer. This paper discusses the results obtained for the UV-IR examinations and the elemental analysis. A comparison with other studies on pre-Hispanic and early colonial codex is presented.

Adsorption and diffusion of strontium in simulated rock fractures quantified via ion beam analysis

2012 ◽  
Vol 76 (8) ◽  
pp. 3203-3215 ◽  
Author(s):  
T. Ohe ◽  
B. Zou ◽  
K. Noshita ◽  
I. Gomez-Morilla ◽  
C. Jeynes ◽  
...  
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Rapid Determination ◽  
Ion Beam ◽  
Effective Diffusion ◽  
Atomic Weight ◽  
Alpha Particles ◽  
Transport Parameters ◽  
Ion Beam Analysis ◽  
Starting Solution ◽  
Beam Analysis

AbstractAn experimental technique has been developed and applied to the problem of determining effective diffusion coefficients and partition coefficients of Sr in low permeability geological materials. This technique, the micro-reactor simulated channel method (MRSC), allows rapid determination of contaminant transport parameters with resulting values comparable to those determined by more traditional methods and also creates product surfaces that are amenable for direct chemical analysis. An attempt to further constrain mass flux was completed by detailed ion beam analysis of polished tuff surfaces (tuff is a polycrystalline polyminerallic aggregate dominated by silicate phases) that had been reacted with Sr solutions at concentrations of 10−5, 10−3 and 10−1 mol l−1. Ion beam analysis was carried out using beams of both protons (using particle induced X-ray emission and elastic backscattering spectrometry or EBS) and alpha-particles (using Rutherford backscattering spectrometry). The ion beam analyses showed that increased solution concentrations resulted in increased surface concentrations and that in the highest concentration experiment, Sr penetrated to at least 4 μm below the primary interface. The Sr surface concentrations determined by EBS were 0.06 (±0.05), 0.87 (±0.30) and 2.40 (±1.0) atomic weight % in the experiments with starting solution concentrations of 10−5, 10−3, and 10−1 mol l−1, respectively.

Characterization and light emission properties of osmium silicides synthesized by low energy ion implantation

2008 ◽  
Vol 1066 ◽  
Author(s):  
Prakash R. Poudel ◽  
K. Hossain ◽  
J. Li ◽  
B. Gorman ◽  
A. Neogi ◽  
...  
Keyword(s):  
Light Emission ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Ion Source ◽  
Alpha Particles ◽  
Low Energy ◽  
Negative Ion ◽  
Tandem Accelerator ◽  
Cross Sectional ◽  
Osmium Silicide

ABSTRACTLow energy (55 KeV) Osmium ( Os− ) negative ion beam was used to implant (5×1016 atoms/cm2 ) into p-type-Si (100). The implantation was performed with the ion source of a National Electrostatic Corp. 3 MV Tandem accelerator. The implanted sample was subsequently annealed at 650 °C in a gas mixture that was 4% H2 + 96% Ar. Rutherford Backscattering spectrometry (RBS) analysis with 1.5 MeV Alpha particles was used to monitor the precipitate formation. Photoluminescence (PL) measurements were also performed to study possible applications of silicides in light emission. Cross-sectional Scanning Electron Microscopy (X-SEM) was performed for topographic image of the implanted region. RBS along with PL measurements indicate that the presence of osmium silicide (Os2Si3) phase for light emission in the implanted region of the sample.

Ion-Beam-Induced Amorphization of Complex Ceramic Materials—Minerals

MRS Bulletin ◽  
1992 ◽  
Vol 17 (5) ◽  
pp. 38-44 ◽  
Author(s):  
L.M. Wang ◽  
R.C. Ewing
Keyword(s):  
Amorphous Materials ◽  
Ion Beam ◽  
Amorphous State ◽  
Analytical Techniques ◽  
Alpha Decay ◽  
Ceramic Materials ◽  
Alpha Particles ◽  
Α Decay ◽  
Conchoidal Fracture ◽  
Metamict Minerals

As early as 1893, mineralogist W.C. Broegger recognized the first example of the transition from the crystalline to aperiodic (amorphous) state in minerals and defined the term “metamikte.” Metamict minerals were considered to be one of three classes of amorphous materials (porodine and hyaline being the other two), but distinguishable as phases that were originally crystalline, as evidenced by well-developed crystal faces. The amorphous state was determined on the basis of a characteristic conchoidal fracture and optical isotropy. There was no mention of radiation damage as a potential cause. In 1914, Hamberg first suggested that metamictization is a radiation-induced, periodic-to-aperiodic phase transition caused by alpha-decay of the constituent radioactive uranium and thorium. In the late 1930s, Stackelberg and Rottenbach tried to test this hypothesis directly by bombarding a thin slab of zircon with alpha particles. Although unsuccessful, the experiment must have been one of the first in which an “ion beam” was used to “modify” a material. After this early effort, there was little research on metamict minerals, and they remained a mineralogical curiosity.R.C. Ewing's interest in this topic began in the early 1970s. Since then, there has been a continuing research program using modern analytical techniques on minerals that have received α-decay doses up to 1026 α-decay events/m3 over geologic time periods up to 109 years. As an example, electron diffraction patterns have shown that naturally occurring zirconolites (CaZrTi2O7) containing varying concentrations of thorium oxide (up to 19 wt% ThO2) are amorphized to different degrees depending on their age and the resulting α-decay event dose (Figure 1).

scholarly journals Particle Induced X-ray Emission (PIXE): A Tool of Qualitative Elemental Analysis for Biological Sample

2013 ◽  
Vol 39 ◽  
pp. 1-10
Author(s):  
M Hasnat Kabir
Keyword(s):  
Detection Limit ◽  
Elemental Analysis ◽  
Biological Sample ◽  
Ion Beam ◽  
Internal Standard ◽  
Energy Calibration ◽  
Pixe Analysis ◽  
X Ray ◽  
University Of Technology ◽  
Good Detection Limit

The facility of ion beam laboratory at Kochi University of Technology (KUT) has been extended by installing the Particle Induced X-ray Emission (PIXE) technique, in order to provide qualitative and quantitative elemental analysis and in-air micro-PIXE analysis. This paper is a description of PIXE setup and its application in biological sample for qualitative elemental analysis. The energy calibration of the system shows linearity. The minimum detection limit indicates that the system has good detection limit. The homogeneity shows uniformity of the sample itself and the internal standard within the sample. A 4 MeV He++ ion beam was used to analyze shellfish samples. Analyzing samples, it was found that the lower Z elements as well as some trace elements were detected. DOI: http://dx.doi.org/10.3329/rujs.v39i0.16538 Rajshahi University J. of Sci. 39, 01-10 (2011)

scholarly journals Proton beam irradiation induces invisible modifications under the surface of painted parchment

2022 ◽  
Vol 12 (1) ◽  
Author(s):  
Katharina Müller ◽  
Zita Szikszai ◽  
Ákos Csepregi ◽  
Róbert Huszánk ◽  
Zsófia Kertész ◽  
...  
Keyword(s):  
Cross Sections ◽  
Ion Beam ◽  
Analytical Techniques ◽  
Proton Radiation ◽  
Proton Beam Irradiation ◽  
Pixe Analysis ◽  
Spatially Resolved ◽  
Radiation Induced ◽  
Induced Changes ◽  
The Impact

AbstractIon beam analysis plays an important role in cultural heritage (CH) studies as it offers a combination of simultaneous and complementary analytical techniques (PIXE/PIGE/RBS) and spatially resolved mapping functions. Despite being considered non-destructive, the potential risk of beam-induced modifications during analysis is increasingly discussed. This work focuses on the impact of proton beams on parchment, present in our CH in form of unique historical manuscripts. Parchment is one of the organic, protein-based CH materials believed to be the most susceptible to radiation-induced changes. Various modification patterns, observed on parchment cross-sections by optical and electron microscopy are reported: discoloration (yellowing), formation of cavities and denaturation of collagen fibers. Considerable modifications were detected up to 100 µm deep into the sample for beam fluences of 4 µC/cm2 and higher. The presence of ultramarine paint on the parchment surface appears to increase the harmful effects of proton radiation. Based on our results, a maximum radiation dose of 0.5 µC/cm2 can be considered as ‘safe boundary’ for 2.3 MeV PIXE analysis of parchment under the applied conditions.

Determination of size and distribution of second phases using nuclear microscopy

1992 ◽  
Vol 7 (9) ◽  
pp. 2373-2378 ◽  
Author(s):  
M.B.H. Breese ◽  
L.T. Romano ◽  
C.J. Salter ◽  
G.W. Grime ◽  
F. Watt
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Analytical Techniques ◽  
Nominal Composition ◽  
Alloy Sample ◽  
Nuclear Microscopy ◽  
High Penetration ◽  
Scanning Transmission ◽  
Second Phases

Nuclear microscopy combines a range of MeV light ion beam analytical techniques such as Proton Induced X-ray Emission (PIXE), Rutherford Backscattering Spectrometry (RBS), and Scanning Transmission Ion Microscopy (STIM). One of the main advantages of using MeV light ion beams for materials characterization is the large analytical volume due to their high penetration depth. This paper shows how nuclear microscopy is used to determine the size and distribution of Pb precipitates in a 40 μm thick alloy sample with a nominal composition of Al–5 wt.% Pb.

scholarly journals Charged particle single nanometre manufacturing

2018 ◽  
Vol 9 ◽  
pp. 2855-2882 ◽  
Author(s):  
Philip D Prewett ◽  
Cornelis W Hagen ◽  
Claudia Lenk ◽  
Steve Lenk ◽  
Marcus Kaestner ◽  
...  
Keyword(s):  
Charged Particle ◽  
High Throughput ◽  
Nanoimprint Lithography ◽  
Ion Beam ◽  
Ambient Air ◽  
Particle Beam ◽  
Vacuum System ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Charged Particle Beam

Following a brief historical summary of the way in which electron beam lithography developed out of the scanning electron microscope, three state-of-the-art charged-particle beam nanopatterning technologies are considered. All three have been the subject of a recently completed European Union Project entitled “Single Nanometre Manufacturing: Beyond CMOS”. Scanning helium ion beam lithography has the advantages of virtually zero proximity effect, nanoscale patterning capability and high sensitivity in combination with a novel fullerene resist based on the sub-nanometre C60 molecule. The shot noise-limited minimum linewidth achieved to date is 6 nm. The second technology, focused electron induced processing (FEBIP), uses a nozzle-dispensed precursor gas either to etch or to deposit patterns on the nanometre scale without the need for resist. The process has potential for high throughput enhancement using multiple electron beams and a system employing up to 196 beams is under development based on a commercial SEM platform. Among its potential applications is the manufacture of templates for nanoimprint lithography, NIL. This is also a target application for the third and final charged particle technology, viz. field emission electron scanning probe lithography, FE-eSPL. This has been developed out of scanning tunneling microscopy using lower-energy electrons (tens of electronvolts rather than the tens of kiloelectronvolts of the other techniques). It has the considerable advantage of being employed without the need for a vacuum system, in ambient air and is capable of sub-10 nm patterning using either developable resists or a self-developing mode applicable for many polymeric resists, which is preferred. Like FEBIP it is potentially capable of massive parallelization for applications requiring high throughput.

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

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